Method of making a semiconductor device

A semiconductor device comprises a semiconductor substrate (110) having a patterned interconnect layer (120) formed thereon. A first capacitor (210), a second capacitor (220), and a resistor (230) are formed over the interconnect layer. The first capacitor comprises a layer of electrode material and...

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Hauptverfasser: MILLER, MELVY F, ZURCHER, PETER, REMMEL, THOMAS P, KALPAT, SRIRAM
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Sprache:eng ; fre ; ger
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creator MILLER, MELVY F
ZURCHER, PETER
REMMEL, THOMAS P
KALPAT, SRIRAM
description A semiconductor device comprises a semiconductor substrate (110) having a patterned interconnect layer (120) formed thereon. A first capacitor (210), a second capacitor (220), and a resistor (230) are formed over the interconnect layer. The first capacitor comprises a layer of electrode material and a first number of dielectric layers. The second capacitor comprises the layer of electrode material and a second number of dielectric layers. The first number of dielectric layers is greater than he second number of dielectric layers such that the first capacitor has a higher capacitance per unit area than does the second capacitor.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1723673B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1723673B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1723673B13</originalsourceid><addsrcrecordid>eNrjZFD3TS3JyE9RyE9TyE3MzsxLV0hUKE7NzUzOz0spTS7JL1JISS3LTE7lYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgGG5kbGZubGTobGRCgBADUcJ08</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method of making a semiconductor device</title><source>esp@cenet</source><creator>MILLER, MELVY F ; ZURCHER, PETER ; REMMEL, THOMAS P ; KALPAT, SRIRAM</creator><creatorcontrib>MILLER, MELVY F ; ZURCHER, PETER ; REMMEL, THOMAS P ; KALPAT, SRIRAM</creatorcontrib><description>A semiconductor device comprises a semiconductor substrate (110) having a patterned interconnect layer (120) formed thereon. A first capacitor (210), a second capacitor (220), and a resistor (230) are formed over the interconnect layer. The first capacitor comprises a layer of electrode material and a first number of dielectric layers. The second capacitor comprises the layer of electrode material and a second number of dielectric layers. The first number of dielectric layers is greater than he second number of dielectric layers such that the first capacitor has a higher capacitance per unit area than does the second capacitor.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130904&amp;DB=EPODOC&amp;CC=EP&amp;NR=1723673B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130904&amp;DB=EPODOC&amp;CC=EP&amp;NR=1723673B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MILLER, MELVY F</creatorcontrib><creatorcontrib>ZURCHER, PETER</creatorcontrib><creatorcontrib>REMMEL, THOMAS P</creatorcontrib><creatorcontrib>KALPAT, SRIRAM</creatorcontrib><title>Method of making a semiconductor device</title><description>A semiconductor device comprises a semiconductor substrate (110) having a patterned interconnect layer (120) formed thereon. A first capacitor (210), a second capacitor (220), and a resistor (230) are formed over the interconnect layer. The first capacitor comprises a layer of electrode material and a first number of dielectric layers. The second capacitor comprises the layer of electrode material and a second number of dielectric layers. The first number of dielectric layers is greater than he second number of dielectric layers such that the first capacitor has a higher capacitance per unit area than does the second capacitor.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD3TS3JyE9RyE9TyE3MzsxLV0hUKE7NzUzOz0spTS7JL1JISS3LTE7lYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgGG5kbGZubGTobGRCgBADUcJ08</recordid><startdate>20130904</startdate><enddate>20130904</enddate><creator>MILLER, MELVY F</creator><creator>ZURCHER, PETER</creator><creator>REMMEL, THOMAS P</creator><creator>KALPAT, SRIRAM</creator><scope>EVB</scope></search><sort><creationdate>20130904</creationdate><title>Method of making a semiconductor device</title><author>MILLER, MELVY F ; ZURCHER, PETER ; REMMEL, THOMAS P ; KALPAT, SRIRAM</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1723673B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2013</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>MILLER, MELVY F</creatorcontrib><creatorcontrib>ZURCHER, PETER</creatorcontrib><creatorcontrib>REMMEL, THOMAS P</creatorcontrib><creatorcontrib>KALPAT, SRIRAM</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MILLER, MELVY F</au><au>ZURCHER, PETER</au><au>REMMEL, THOMAS P</au><au>KALPAT, SRIRAM</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of making a semiconductor device</title><date>2013-09-04</date><risdate>2013</risdate><abstract>A semiconductor device comprises a semiconductor substrate (110) having a patterned interconnect layer (120) formed thereon. A first capacitor (210), a second capacitor (220), and a resistor (230) are formed over the interconnect layer. The first capacitor comprises a layer of electrode material and a first number of dielectric layers. The second capacitor comprises the layer of electrode material and a second number of dielectric layers. The first number of dielectric layers is greater than he second number of dielectric layers such that the first capacitor has a higher capacitance per unit area than does the second capacitor.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Method of making a semiconductor device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T19%3A48%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MILLER,%20MELVY%20F&rft.date=2013-09-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP1723673B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true