Eddy current inspection method and system

Eddy current inspection method and system

An eddy current inspection system (5) and method for inspecting a component (12) is provided. The system includes an eddy current probe (18) for sensing eddy currents from the component and an analog to digital converter (26) configured for converting eddy currents to digital signals. The system als...

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Hauptverfasser: SHYAMSUNDER, MT, GAMBRELL, GIGI OLIVE, DUTTA, AMITABHA, PISUPATI, PREETI
Format: Patent
Sprache:eng ; fre ; ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator SHYAMSUNDER, MT
GAMBRELL, GIGI OLIVE
DUTTA, AMITABHA
PISUPATI, PREETI
description An eddy current inspection system (5) and method for inspecting a component (12) is provided. The system includes an eddy current probe (18) for sensing eddy currents from the component and an analog to digital converter (26) configured for converting eddy currents to digital signals. The system also includes a processor (30) configured for generating an eddy current image (61) from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Eddy current inspection method and system
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