SYSTEM FOR DETERMINING THE STAIN QUALITY OF SLIDES USING SCATTER PLOT DISTRIBUTIONS

Methods, systems, and computer software for determining the stain quality of a plurality of biological specimens. A number of objects of interest are identified in a biological specimen. A first feature of each object of interest (e.g., nuclear area) and a second feature of each object of interest (...

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Hauptverfasser:	ZAHNISER, DAVID, WONG, KAM, L, ISENSTEIN, LOUISE
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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creator	ZAHNISER, DAVID WONG, KAM, L ISENSTEIN, LOUISE
description	Methods, systems, and computer software for determining the stain quality of a plurality of biological specimens. A number of objects of interest are identified in a biological specimen. A first feature of each object of interest (e.g., nuclear area) and a second feature of each object of interest (e.g., nuclear integrated optical density) are measured, and a scatter plot of the first and second features is generated. The stain quality of the specimens are determined based on the distribution of points within the scatter plot.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1631814A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1631814A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1631814A13</originalsourceid><addsrcrecordid>eNqNyrEKwjAQANAsDqL-w_1Ah1AR19hc7EGa1Nxl6FSKxEm0UP8fFfwAp7e8tWIeWLADFxNYFEwdBQpnkBaBxVCASzaeZIDogD1ZZMj8HdwY-XzofRSwxJLolIVi4K1a3ab7UnY_NwocStNWZX6OZZmna3mU14i9PtT6qPdG13-UN9UPL-Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM FOR DETERMINING THE STAIN QUALITY OF SLIDES USING SCATTER PLOT DISTRIBUTIONS</title><source>esp@cenet</source><creator>ZAHNISER, DAVID ; WONG, KAM, L ; ISENSTEIN, LOUISE</creator><creatorcontrib>ZAHNISER, DAVID ; WONG, KAM, L ; ISENSTEIN, LOUISE</creatorcontrib><description>Methods, systems, and computer software for determining the stain quality of a plurality of biological specimens. A number of objects of interest are identified in a biological specimen. A first feature of each object of interest (e.g., nuclear area) and a second feature of each object of interest (e.g., nuclear integrated optical density) are measured, and a scatter plot of the first and second features is generated. The stain quality of the specimens are determined based on the distribution of points within the scatter plot.</description><edition>7</edition><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060308&DB=EPODOC&CC=EP&NR=1631814A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060308&DB=EPODOC&CC=EP&NR=1631814A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZAHNISER, DAVID</creatorcontrib><creatorcontrib>WONG, KAM, L</creatorcontrib><creatorcontrib>ISENSTEIN, LOUISE</creatorcontrib><title>SYSTEM FOR DETERMINING THE STAIN QUALITY OF SLIDES USING SCATTER PLOT DISTRIBUTIONS</title><description>Methods, systems, and computer software for determining the stain quality of a plurality of biological specimens. A number of objects of interest are identified in a biological specimen. A first feature of each object of interest (e.g., nuclear area) and a second feature of each object of interest (e.g., nuclear integrated optical density) are measured, and a scatter plot of the first and second features is generated. The stain quality of the specimens are determined based on the distribution of points within the scatter plot.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAsDqL-w_1Ah1AR19hc7EGa1Nxl6FSKxEm0UP8fFfwAp7e8tWIeWLADFxNYFEwdBQpnkBaBxVCASzaeZIDogD1ZZMj8HdwY-XzofRSwxJLolIVi4K1a3ab7UnY_NwocStNWZX6OZZmna3mU14i9PtT6qPdG13-UN9UPL-Q</recordid><startdate>20060308</startdate><enddate>20060308</enddate><creator>ZAHNISER, DAVID</creator><creator>WONG, KAM, L</creator><creator>ISENSTEIN, LOUISE</creator><scope>EVB</scope></search><sort><creationdate>20060308</creationdate><title>SYSTEM FOR DETERMINING THE STAIN QUALITY OF SLIDES USING SCATTER PLOT DISTRIBUTIONS</title><author>ZAHNISER, DAVID ; WONG, KAM, L ; ISENSTEIN, LOUISE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1631814A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2006</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZAHNISER, DAVID</creatorcontrib><creatorcontrib>WONG, KAM, L</creatorcontrib><creatorcontrib>ISENSTEIN, LOUISE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZAHNISER, DAVID</au><au>WONG, KAM, L</au><au>ISENSTEIN, LOUISE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM FOR DETERMINING THE STAIN QUALITY OF SLIDES USING SCATTER PLOT DISTRIBUTIONS</title><date>2006-03-08</date><risdate>2006</risdate><abstract>Methods, systems, and computer software for determining the stain quality of a plurality of biological specimens. A number of objects of interest are identified in a biological specimen. A first feature of each object of interest (e.g., nuclear area) and a second feature of each object of interest (e.g., nuclear integrated optical density) are measured, and a scatter plot of the first and second features is generated. The stain quality of the specimens are determined based on the distribution of points within the scatter plot.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
title	SYSTEM FOR DETERMINING THE STAIN QUALITY OF SLIDES USING SCATTER PLOT DISTRIBUTIONS
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T00%3A31%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZAHNISER,%20DAVID&rft.date=2006-03-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP1631814A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true