Gamma camera with two sequential correction maps

Gamma camera with two sequential correction maps

A method of correcting errors in imaging data in a Gamma Camera including determining a first correction map based on one or both of (1) calculated corrections and (2) a first data acquisition, determining a second correction map based on a second data acquisition and correcting the imaging data bas...

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Hauptverfasser: BERLAD, GIDEON, WAINER, NAOR
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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creator BERLAD, GIDEON
WAINER, NAOR
description A method of correcting errors in imaging data in a Gamma Camera including determining a first correction map based on one or both of (1) calculated corrections and (2) a first data acquisition, determining a second correction map based on a second data acquisition and correcting the imaging data based on the first and second correction maps. In a preferred embodiment of the invention, error correction is implemented using a neutral network. Alternatively, a neural network can be used to perform the entire calculation of event position and/or energy.
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In a preferred embodiment of the invention, error correction is implemented using a neutral network. Alternatively, a neural network can be used to perform the entire calculation of event position and/or energy.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
title Gamma camera with two sequential correction maps
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