Method and apparatus for producing perturbation signals
A method and apparatus are provided for designing perturbation signals to excite a number of input variables of a system, in order to test that system for the purpose of obtaining models for the synthesis of a model-based controller. The method begins with providing input parameters (400) of the sys...
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| creator | KOTHARE, SIMONE L MANDLER, JORGE ANIBAL |
| description | A method and apparatus are provided for designing perturbation signals to excite a number of input variables of a system, in order to test that system for the purpose of obtaining models for the synthesis of a model-based controller. The method begins with providing input parameters (400) of the system. A plurality of binary multi-frequency (BMF) signals are generated (408) based on these input parameters and the frequency spectra of these BMF signals are calculated (410). One BMF signal is selected (412) out of the set of BMF signals so that the frequency spectrum of the selected BMF signal most closely matches a desired frequency spectrum specified by the input parameters. The selected BMF signal is used (418) as a first perturbation signal for testing the system. The selected BMF signal is also shifted (422) by predetermined amounts of samples to create delayed copies of the original BMF signal (424) to be used as additional perturbation signals. |
| format | Patent |
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The method begins with providing input parameters (400) of the system. A plurality of binary multi-frequency (BMF) signals are generated (408) based on these input parameters and the frequency spectra of these BMF signals are calculated (410). One BMF signal is selected (412) out of the set of BMF signals so that the frequency spectrum of the selected BMF signal most closely matches a desired frequency spectrum specified by the input parameters. The selected BMF signal is used (418) as a first perturbation signal for testing the system. 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The method begins with providing input parameters (400) of the system. A plurality of binary multi-frequency (BMF) signals are generated (408) based on these input parameters and the frequency spectra of these BMF signals are calculated (410). One BMF signal is selected (412) out of the set of BMF signals so that the frequency spectrum of the selected BMF signal most closely matches a desired frequency spectrum specified by the input parameters. The selected BMF signal is used (418) as a first perturbation signal for testing the system. The selected BMF signal is also shifted (422) by predetermined amounts of samples to create delayed copies of the original BMF signal (424) to be used as additional perturbation signals.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS PULSE TECHNIQUE REGULATING SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | Method and apparatus for producing perturbation signals |
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