Analyzer for metal
The present invention relates to the field of chemical analysis of metal material. The original position analyzer for metal is composed of the emission source system, the light dispersion system, the high-speed single discharge signal collection system, the signal analysis system that conducts numer...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The present invention relates to the field of chemical analysis of metal material. The original position analyzer for metal is composed of the emission source system, the light dispersion system, the high-speed single discharge signal collection system, the signal analysis system that conducts numeric resolution on the single discharge spectrum, as well as the sample moving/positioning system with continued excitation and synchronized scanning. The present invention conducts synchronal scanning of the sample, performs continuous movement and continuous spark discharge of the sample, adopts light dispersion and high speed signal collection, keeps real time record in a digital form, and conducts statistic analysis of the chemical composition, elementary distribution, porosity and inclusion distribution simultaneously. The results are accurate and complete. |
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