METHOD FOR CORRECTING PHYSICAL ERRORS IN MEASURING MICROSCOPIC OBJECTS

METHOD FOR CORRECTING PHYSICAL ERRORS IN MEASURING MICROSCOPIC OBJECTS

A method of correcting physically conditioned errors in the measurement of an object detects an image of the object to be measured, measures the imaged object, determines a measurement error caused by structural surroundings of the object, and corrects the measurement result in dependence on the mea...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: EISENMANN, HANS, WAAS, THOMAS, BRUECK, HANS-JUERGEN, HARTMANN, HANS
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator EISENMANN, HANS
WAAS, THOMAS
BRUECK, HANS-JUERGEN
HARTMANN, HANS
description A method of correcting physically conditioned errors in the measurement of an object detects an image of the object to be measured, measures the imaged object, determines a measurement error caused by structural surroundings of the object, and corrects the measurement result in dependence on the measurement error.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1330628A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1330628A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1330628A13</originalsourceid><addsrcrecordid>eNrjZHDzdQ3x8HdRcPMPUnD2DwpydQ7x9HNXCPCIDPZ0dvRRcA0K8g8KVvD0U_B1dQwODQJJ-no6B_kHO_sHeDor-Dt5AbUE8zCwpiXmFKfyQmluBgU31xBnD93Ugvz41OKCxOTUvNSSeNcAQ2NjAzMjC0dDYyKUAAByaSwc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR CORRECTING PHYSICAL ERRORS IN MEASURING MICROSCOPIC OBJECTS</title><source>esp@cenet</source><creator>EISENMANN, HANS ; WAAS, THOMAS ; BRUECK, HANS-JUERGEN ; HARTMANN, HANS</creator><creatorcontrib>EISENMANN, HANS ; WAAS, THOMAS ; BRUECK, HANS-JUERGEN ; HARTMANN, HANS</creatorcontrib><description>A method of correcting physically conditioned errors in the measurement of an object detects an image of the object to be measured, measures the imaged object, determines a measurement error caused by structural surroundings of the object, and corrects the measurement result in dependence on the measurement error.</description><edition>7</edition><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20030730&amp;DB=EPODOC&amp;CC=EP&amp;NR=1330628A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20030730&amp;DB=EPODOC&amp;CC=EP&amp;NR=1330628A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>EISENMANN, HANS</creatorcontrib><creatorcontrib>WAAS, THOMAS</creatorcontrib><creatorcontrib>BRUECK, HANS-JUERGEN</creatorcontrib><creatorcontrib>HARTMANN, HANS</creatorcontrib><title>METHOD FOR CORRECTING PHYSICAL ERRORS IN MEASURING MICROSCOPIC OBJECTS</title><description>A method of correcting physically conditioned errors in the measurement of an object detects an image of the object to be measured, measures the imaged object, determines a measurement error caused by structural surroundings of the object, and corrects the measurement result in dependence on the measurement error.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDzdQ3x8HdRcPMPUnD2DwpydQ7x9HNXCPCIDPZ0dvRRcA0K8g8KVvD0U_B1dQwODQJJ-no6B_kHO_sHeDor-Dt5AbUE8zCwpiXmFKfyQmluBgU31xBnD93Ugvz41OKCxOTUvNSSeNcAQ2NjAzMjC0dDYyKUAAByaSwc</recordid><startdate>20030730</startdate><enddate>20030730</enddate><creator>EISENMANN, HANS</creator><creator>WAAS, THOMAS</creator><creator>BRUECK, HANS-JUERGEN</creator><creator>HARTMANN, HANS</creator><scope>EVB</scope></search><sort><creationdate>20030730</creationdate><title>METHOD FOR CORRECTING PHYSICAL ERRORS IN MEASURING MICROSCOPIC OBJECTS</title><author>EISENMANN, HANS ; WAAS, THOMAS ; BRUECK, HANS-JUERGEN ; HARTMANN, HANS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1330628A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2003</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>EISENMANN, HANS</creatorcontrib><creatorcontrib>WAAS, THOMAS</creatorcontrib><creatorcontrib>BRUECK, HANS-JUERGEN</creatorcontrib><creatorcontrib>HARTMANN, HANS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>EISENMANN, HANS</au><au>WAAS, THOMAS</au><au>BRUECK, HANS-JUERGEN</au><au>HARTMANN, HANS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR CORRECTING PHYSICAL ERRORS IN MEASURING MICROSCOPIC OBJECTS</title><date>2003-07-30</date><risdate>2003</risdate><abstract>A method of correcting physically conditioned errors in the measurement of an object detects an image of the object to be measured, measures the imaged object, determines a measurement error caused by structural surroundings of the object, and corrects the measurement result in dependence on the measurement error.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP1330628A1
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
title METHOD FOR CORRECTING PHYSICAL ERRORS IN MEASURING MICROSCOPIC OBJECTS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T14%3A36%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=EISENMANN,%20HANS&rft.date=2003-07-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP1330628A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true