Memory tester

A memory tester (6) is equipped with History FIFO's (91-98, 124-127) whose depths are adjusted to account for the sum of the delays of the pipelines, relative to the location of that History FIFO's (91-98,124-127) whose depths are adjusted to accound for the sum of the delays of the pipeli...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	JORDAN, STEPHEN D, KRECH, ALAN S
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!