A method of fault isolation of a digital electronic device

A method of fault isolation comprises the steps of attaching a probe to at least one pin of each sub-circuit (32-38) of the digital electronic device (10). A predefined stimulus (20) is sent to the digital electronic device and a transmission from 0 to 1 is counted for each of the probes to obtain a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LINK, BRUCE A, PETRUCCELLI, GREGORY D, HADGIS, GEORGE A
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING
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