Direct etch for thin film resistor using a hard mask

A method of etching a thin film resistor material, such as CrSi, for producing a thin film resistor, a non-photoresist hard mask is deposited on an exposed surface of thin film resistor material, a delineated portion of the hard mask is etched with a hydrogen peroxide etchant that does not affect th...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: GAUL, STEVE, GASNER, JOHN T, LINN, JACK H, MCCARTY, CHRIS
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator GAUL, STEVE
GASNER, JOHN T
LINN, JACK H
MCCARTY, CHRIS
description A method of etching a thin film resistor material, such as CrSi, for producing a thin film resistor, a non-photoresist hard mask is deposited on an exposed surface of thin film resistor material, a delineated portion of the hard mask is etched with a hydrogen peroxide etchant that does not affect the thin film resistor material to expose the material underneath, and the exposed thin film resistor material is etched with a second etchant that does not affect the hard mask. The second etchant may be a mixture of phosphoric acid, nitric acid and hydrofluoric acid The hard mask comprises TiW.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1235264A2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1235264A2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1235264A23</originalsourceid><addsrcrecordid>eNrjZDBxySxKTS5RSC1JzlBIyy9SKMnIzFNIy8zJVShKLc4sLgEKlRZn5qUrJCpkJBalKOQmFmfzMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JJ41wBDI2NTIzMTRyNjIpQAAJX5K8E</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Direct etch for thin film resistor using a hard mask</title><source>esp@cenet</source><creator>GAUL, STEVE ; GASNER, JOHN T ; LINN, JACK H ; MCCARTY, CHRIS</creator><creatorcontrib>GAUL, STEVE ; GASNER, JOHN T ; LINN, JACK H ; MCCARTY, CHRIS</creatorcontrib><description>A method of etching a thin film resistor material, such as CrSi, for producing a thin film resistor, a non-photoresist hard mask is deposited on an exposed surface of thin film resistor material, a delineated portion of the hard mask is etched with a hydrogen peroxide etchant that does not affect the thin film resistor material to expose the material underneath, and the exposed thin film resistor material is etched with a second etchant that does not affect the hard mask. The second etchant may be a mixture of phosphoric acid, nitric acid and hydrofluoric acid The hard mask comprises TiW.</description><edition>7</edition><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ; PRINTED CIRCUITS ; SEMICONDUCTOR DEVICES</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20020828&amp;DB=EPODOC&amp;CC=EP&amp;NR=1235264A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20020828&amp;DB=EPODOC&amp;CC=EP&amp;NR=1235264A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GAUL, STEVE</creatorcontrib><creatorcontrib>GASNER, JOHN T</creatorcontrib><creatorcontrib>LINN, JACK H</creatorcontrib><creatorcontrib>MCCARTY, CHRIS</creatorcontrib><title>Direct etch for thin film resistor using a hard mask</title><description>A method of etching a thin film resistor material, such as CrSi, for producing a thin film resistor, a non-photoresist hard mask is deposited on an exposed surface of thin film resistor material, a delineated portion of the hard mask is etched with a hydrogen peroxide etchant that does not affect the thin film resistor material to expose the material underneath, and the exposed thin film resistor material is etched with a second etchant that does not affect the hard mask. The second etchant may be a mixture of phosphoric acid, nitric acid and hydrofluoric acid The hard mask comprises TiW.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</subject><subject>PRINTED CIRCUITS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBxySxKTS5RSC1JzlBIyy9SKMnIzFNIy8zJVShKLc4sLgEKlRZn5qUrJCpkJBalKOQmFmfzMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JJ41wBDI2NTIzMTRyNjIpQAAJX5K8E</recordid><startdate>20020828</startdate><enddate>20020828</enddate><creator>GAUL, STEVE</creator><creator>GASNER, JOHN T</creator><creator>LINN, JACK H</creator><creator>MCCARTY, CHRIS</creator><scope>EVB</scope></search><sort><creationdate>20020828</creationdate><title>Direct etch for thin film resistor using a hard mask</title><author>GAUL, STEVE ; GASNER, JOHN T ; LINN, JACK H ; MCCARTY, CHRIS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1235264A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2002</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</topic><topic>PRINTED CIRCUITS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>GAUL, STEVE</creatorcontrib><creatorcontrib>GASNER, JOHN T</creatorcontrib><creatorcontrib>LINN, JACK H</creatorcontrib><creatorcontrib>MCCARTY, CHRIS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GAUL, STEVE</au><au>GASNER, JOHN T</au><au>LINN, JACK H</au><au>MCCARTY, CHRIS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Direct etch for thin film resistor using a hard mask</title><date>2002-08-28</date><risdate>2002</risdate><abstract>A method of etching a thin film resistor material, such as CrSi, for producing a thin film resistor, a non-photoresist hard mask is deposited on an exposed surface of thin film resistor material, a delineated portion of the hard mask is etched with a hydrogen peroxide etchant that does not affect the thin film resistor material to expose the material underneath, and the exposed thin film resistor material is etched with a second etchant that does not affect the hard mask. The second etchant may be a mixture of phosphoric acid, nitric acid and hydrofluoric acid The hard mask comprises TiW.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP1235264A2
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
PRINTED CIRCUITS
SEMICONDUCTOR DEVICES
title Direct etch for thin film resistor using a hard mask
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T14%3A29%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=GAUL,%20STEVE&rft.date=2002-08-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP1235264A2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true