X-RAY FLUORESCENCE SENSOR FOR MEASUREMENT OF METAL SHEET THICKNESS
The invention refers to a device for measurement of the thickness of a first layer, comprising one or more sublayers, on a second layer of a metal sheet by X-ray fluorescence analysis comprising means for generating and directing a beam of polychromatic primary X-rays, said beam being able to penetr...
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| creator | HASZLER, ALFRED, JOHANN, PETER GHAZIARY, HORMOZ |
| description | The invention refers to a device for measurement of the thickness of a first layer, comprising one or more sublayers, on a second layer of a metal sheet by X-ray fluorescence analysis comprising means for generating and directing a beam of polychromatic primary X-rays, said beam being able to penetrate into the first and second layers for converting primary X-rays into chemical element specific fluorescent X-rays by means of absorption of primary X-rays and re-emission of fluorescent X-rays by the chemical element, and further comprising means for detecting element specific fluorescent X-rays and determining an intensity thereof. The means for detection have been placed at an angle with respect to the primary beam of X-rays in dependence of the chemical element from which the fluorescent X-rays are to be detected. Herewith an improvement of the efficiency of detection is achieved, and the measurement time is reduced accordingly. Hence, a device is provided with which alloys with a low concentration of fluorescent elements can now be analysed, for determining the thickness of a cladding. |
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The means for detection have been placed at an angle with respect to the primary beam of X-rays in dependence of the chemical element from which the fluorescent X-rays are to be detected. Herewith an improvement of the efficiency of detection is achieved, and the measurement time is reduced accordingly. Hence, a device is provided with which alloys with a low concentration of fluorescent elements can now be analysed, for determining the thickness of a cladding.</description><edition>7</edition><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030625&DB=EPODOC&CC=EP&NR=1208353B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030625&DB=EPODOC&CC=EP&NR=1208353B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HASZLER, ALFRED, JOHANN, PETER</creatorcontrib><creatorcontrib>GHAZIARY, HORMOZ</creatorcontrib><title>X-RAY FLUORESCENCE SENSOR FOR MEASUREMENT OF METAL SHEET THICKNESS</title><description>The invention refers to a device for measurement of the thickness of a first layer, comprising one or more sublayers, on a second layer of a metal sheet by X-ray fluorescence analysis comprising means for generating and directing a beam of polychromatic primary X-rays, said beam being able to penetrate into the first and second layers for converting primary X-rays into chemical element specific fluorescent X-rays by means of absorption of primary X-rays and re-emission of fluorescent X-rays by the chemical element, and further comprising means for detecting element specific fluorescent X-rays and determining an intensity thereof. The means for detection have been placed at an angle with respect to the primary beam of X-rays in dependence of the chemical element from which the fluorescent X-rays are to be detected. Herewith an improvement of the efficiency of detection is achieved, and the measurement time is reduced accordingly. Hence, a device is provided with which alloys with a low concentration of fluorescent elements can now be analysed, for determining the thickness of a cladding.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHCK0A1yjFRw8wn1D3INdnb1c3ZVCHb1C_YPUnADYl9Xx-DQIFdfV78QBX83IDfE0Uch2MPVNUQhxMPT2dvPNTiYh4E1LTGnOJUXSnMzKLi5hjh76KYW5MenFhckJqfmpZbEuwYYGhlYGJsaOxkaE6EEALoWKuI</recordid><startdate>20030625</startdate><enddate>20030625</enddate><creator>HASZLER, ALFRED, JOHANN, PETER</creator><creator>GHAZIARY, HORMOZ</creator><scope>EVB</scope></search><sort><creationdate>20030625</creationdate><title>X-RAY FLUORESCENCE SENSOR FOR MEASUREMENT OF METAL SHEET THICKNESS</title><author>HASZLER, ALFRED, JOHANN, PETER ; GHAZIARY, HORMOZ</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1208353B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2003</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HASZLER, ALFRED, JOHANN, PETER</creatorcontrib><creatorcontrib>GHAZIARY, HORMOZ</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HASZLER, ALFRED, JOHANN, PETER</au><au>GHAZIARY, HORMOZ</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>X-RAY FLUORESCENCE SENSOR FOR MEASUREMENT OF METAL SHEET THICKNESS</title><date>2003-06-25</date><risdate>2003</risdate><abstract>The invention refers to a device for measurement of the thickness of a first layer, comprising one or more sublayers, on a second layer of a metal sheet by X-ray fluorescence analysis comprising means for generating and directing a beam of polychromatic primary X-rays, said beam being able to penetrate into the first and second layers for converting primary X-rays into chemical element specific fluorescent X-rays by means of absorption of primary X-rays and re-emission of fluorescent X-rays by the chemical element, and further comprising means for detecting element specific fluorescent X-rays and determining an intensity thereof. The means for detection have been placed at an angle with respect to the primary beam of X-rays in dependence of the chemical element from which the fluorescent X-rays are to be detected. Herewith an improvement of the efficiency of detection is achieved, and the measurement time is reduced accordingly. Hence, a device is provided with which alloys with a low concentration of fluorescent elements can now be analysed, for determining the thickness of a cladding.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | X-RAY FLUORESCENCE SENSOR FOR MEASUREMENT OF METAL SHEET THICKNESS |
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