METHOD OF SUPPRESSING ANOMALOUS INCREASES IN THE THRESHOLD VOLTAGE OF A SEMICONDUCTOR DEVICE
In an example embodiment, a method for manufacturing a semiconductor device having shallow trench isolation comprises forming a trench region in a substrate having a substantially planar bottom, a first and second sidewall. In the trench region, the method forms a dielectric liner on the bottom and...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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