COMPENSATING FOR THE EFFECTS OF ROUND-TRIP DELAY IN AUTOMATIC TEST EQUIPMENT

COMPENSATING FOR THE EFFECTS OF ROUND-TRIP DELAY IN AUTOMATIC TEST EQUIPMENT

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1. Verfasser: BOWHERS, WILLIAM, J
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title COMPENSATING FOR THE EFFECTS OF ROUND-TRIP DELAY IN AUTOMATIC TEST EQUIPMENT
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