BOUNDARY SCAN SYSTEM WITH ADDRESS DEPENDENT INSTRUCTIONS

Boundary Scan integrated circuits are provided with a plurality of new registers between two dedicated pins, Test Data In (TDI) and Test Data Out (TDO) pins. The new registers include an address register and a plurality of test data registers which are addressable by the address register using addre...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	FAHEY, JAMES, JR, TAM, JINGLUN, GONGWER, GEOFFREY S, RAMAMURTHY, SRINIVAS
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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