METAL ION SPECIFIC CAPACITY AFFINITY SENSOR

This invention relates to a metal ion specific capacitance sensor with exceptional sensitivity and wide operating range. It is versatile because different kinds of recognition elements can be immobilized directly in a self-assembling monolayer substantially completely covering the surface of the mea...

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Hauptverfasser: HOBMAN, JONATHAN, CORBISIER, PHILIPPE, BERGGREN, CHRISTINE, BROWN, NIGEL, LLOYD, JONATHAN, JAKEMAN, KENNETH, CSOEREGI, ELISABETH, VAN DER LELIE, DANIEL, MATTIASSON, BO, JOHANSSON, GILLIS, BONTIDEAN, IBOLYA, WILSON, JONATHAN
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creator HOBMAN, JONATHAN
CORBISIER, PHILIPPE
BERGGREN, CHRISTINE
BROWN, NIGEL
LLOYD, JONATHAN
JAKEMAN, KENNETH
CSOEREGI, ELISABETH
VAN DER LELIE, DANIEL
MATTIASSON, BO
JOHANSSON, GILLIS
BONTIDEAN, IBOLYA
WILSON, JONATHAN
description This invention relates to a metal ion specific capacitance sensor with exceptional sensitivity and wide operating range. It is versatile because different kinds of recognition elements can be immobilized directly in a self-assembling monolayer substantially completely covering the surface of the measuring noble metal electrode. The electrode then becomes selective to those metal ions in the solution that show affinity to the recognition element on the surface. Compared to previously described electrochemical sensors, the sensor according to the present invention shows many orders of magnitude better sensitivity because of the unique measuring principle.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1018011B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1018011B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1018011B13</originalsourceid><addsrcrecordid>eNrjZND2dQ1x9FHw9PdTCA5wdfZ083RWcHYMcHT2DIlUcHRz8_QDMYJd_YL9g3gYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbxrgKGBoYWBoaGToTERSgAevyRV</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METAL ION SPECIFIC CAPACITY AFFINITY SENSOR</title><source>esp@cenet</source><creator>HOBMAN, JONATHAN ; CORBISIER, PHILIPPE ; BERGGREN, CHRISTINE ; BROWN, NIGEL ; LLOYD, JONATHAN ; JAKEMAN, KENNETH ; CSOEREGI, ELISABETH ; VAN DER LELIE, DANIEL ; MATTIASSON, BO ; JOHANSSON, GILLIS ; BONTIDEAN, IBOLYA ; WILSON, JONATHAN</creator><creatorcontrib>HOBMAN, JONATHAN ; CORBISIER, PHILIPPE ; BERGGREN, CHRISTINE ; BROWN, NIGEL ; LLOYD, JONATHAN ; JAKEMAN, KENNETH ; CSOEREGI, ELISABETH ; VAN DER LELIE, DANIEL ; MATTIASSON, BO ; JOHANSSON, GILLIS ; BONTIDEAN, IBOLYA ; WILSON, JONATHAN</creatorcontrib><description>This invention relates to a metal ion specific capacitance sensor with exceptional sensitivity and wide operating range. It is versatile because different kinds of recognition elements can be immobilized directly in a self-assembling monolayer substantially completely covering the surface of the measuring noble metal electrode. The electrode then becomes selective to those metal ions in the solution that show affinity to the recognition element on the surface. Compared to previously described electrochemical sensors, the sensor according to the present invention shows many orders of magnitude better sensitivity because of the unique measuring principle.</description><edition>7</edition><language>eng ; fre ; ger</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20040804&amp;DB=EPODOC&amp;CC=EP&amp;NR=1018011B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20040804&amp;DB=EPODOC&amp;CC=EP&amp;NR=1018011B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HOBMAN, JONATHAN</creatorcontrib><creatorcontrib>CORBISIER, PHILIPPE</creatorcontrib><creatorcontrib>BERGGREN, CHRISTINE</creatorcontrib><creatorcontrib>BROWN, NIGEL</creatorcontrib><creatorcontrib>LLOYD, JONATHAN</creatorcontrib><creatorcontrib>JAKEMAN, KENNETH</creatorcontrib><creatorcontrib>CSOEREGI, ELISABETH</creatorcontrib><creatorcontrib>VAN DER LELIE, DANIEL</creatorcontrib><creatorcontrib>MATTIASSON, BO</creatorcontrib><creatorcontrib>JOHANSSON, GILLIS</creatorcontrib><creatorcontrib>BONTIDEAN, IBOLYA</creatorcontrib><creatorcontrib>WILSON, JONATHAN</creatorcontrib><title>METAL ION SPECIFIC CAPACITY AFFINITY SENSOR</title><description>This invention relates to a metal ion specific capacitance sensor with exceptional sensitivity and wide operating range. It is versatile because different kinds of recognition elements can be immobilized directly in a self-assembling monolayer substantially completely covering the surface of the measuring noble metal electrode. The electrode then becomes selective to those metal ions in the solution that show affinity to the recognition element on the surface. Compared to previously described electrochemical sensors, the sensor according to the present invention shows many orders of magnitude better sensitivity because of the unique measuring principle.</description><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SCANNING-PROBE TECHNIQUES OR APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND2dQ1x9FHw9PdTCA5wdfZ083RWcHYMcHT2DIlUcHRz8_QDMYJd_YL9g3gYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbxrgKGBoYWBoaGToTERSgAevyRV</recordid><startdate>20040804</startdate><enddate>20040804</enddate><creator>HOBMAN, JONATHAN</creator><creator>CORBISIER, PHILIPPE</creator><creator>BERGGREN, CHRISTINE</creator><creator>BROWN, NIGEL</creator><creator>LLOYD, JONATHAN</creator><creator>JAKEMAN, KENNETH</creator><creator>CSOEREGI, ELISABETH</creator><creator>VAN DER LELIE, DANIEL</creator><creator>MATTIASSON, BO</creator><creator>JOHANSSON, GILLIS</creator><creator>BONTIDEAN, IBOLYA</creator><creator>WILSON, JONATHAN</creator><scope>EVB</scope></search><sort><creationdate>20040804</creationdate><title>METAL ION SPECIFIC CAPACITY AFFINITY SENSOR</title><author>HOBMAN, JONATHAN ; CORBISIER, PHILIPPE ; BERGGREN, CHRISTINE ; BROWN, NIGEL ; LLOYD, JONATHAN ; JAKEMAN, KENNETH ; CSOEREGI, ELISABETH ; VAN DER LELIE, DANIEL ; MATTIASSON, BO ; JOHANSSON, GILLIS ; BONTIDEAN, IBOLYA ; WILSON, JONATHAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1018011B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2004</creationdate><topic>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SCANNING-PROBE TECHNIQUES OR APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HOBMAN, JONATHAN</creatorcontrib><creatorcontrib>CORBISIER, PHILIPPE</creatorcontrib><creatorcontrib>BERGGREN, CHRISTINE</creatorcontrib><creatorcontrib>BROWN, NIGEL</creatorcontrib><creatorcontrib>LLOYD, JONATHAN</creatorcontrib><creatorcontrib>JAKEMAN, KENNETH</creatorcontrib><creatorcontrib>CSOEREGI, ELISABETH</creatorcontrib><creatorcontrib>VAN DER LELIE, DANIEL</creatorcontrib><creatorcontrib>MATTIASSON, BO</creatorcontrib><creatorcontrib>JOHANSSON, GILLIS</creatorcontrib><creatorcontrib>BONTIDEAN, IBOLYA</creatorcontrib><creatorcontrib>WILSON, JONATHAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HOBMAN, JONATHAN</au><au>CORBISIER, PHILIPPE</au><au>BERGGREN, CHRISTINE</au><au>BROWN, NIGEL</au><au>LLOYD, JONATHAN</au><au>JAKEMAN, KENNETH</au><au>CSOEREGI, ELISABETH</au><au>VAN DER LELIE, DANIEL</au><au>MATTIASSON, BO</au><au>JOHANSSON, GILLIS</au><au>BONTIDEAN, IBOLYA</au><au>WILSON, JONATHAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METAL ION SPECIFIC CAPACITY AFFINITY SENSOR</title><date>2004-08-04</date><risdate>2004</risdate><abstract>This invention relates to a metal ion specific capacitance sensor with exceptional sensitivity and wide operating range. It is versatile because different kinds of recognition elements can be immobilized directly in a self-assembling monolayer substantially completely covering the surface of the measuring noble metal electrode. The electrode then becomes selective to those metal ions in the solution that show affinity to the recognition element on the surface. Compared to previously described electrochemical sensors, the sensor according to the present invention shows many orders of magnitude better sensitivity because of the unique measuring principle.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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language eng ; fre ; ger
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subjects APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
title METAL ION SPECIFIC CAPACITY AFFINITY SENSOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T10%3A06%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HOBMAN,%20JONATHAN&rft.date=2004-08-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP1018011B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true