METHOD FOR DETERMINING VERY LOW CAPACITIES AND SENSOR DESIGNED THEREFOR

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Hauptverfasser: MARKSTEINER, STEPHAN, SCHEITER, THOMAS, VON BASSE, PAUL-WERNER, WILLER, JOSEF
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Sprache:eng ; fre ; ger
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creator MARKSTEINER, STEPHAN
SCHEITER, THOMAS
VON BASSE, PAUL-WERNER
WILLER, JOSEF
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP1000362A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP1000362A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP1000362A13</originalsourceid><addsrcrecordid>eNrjZHD3dQ3x8HdRcPMPUnBxDXEN8vX08_RzVwhzDYpU8PEPV3B2DHB09gzxdA1WcPRzUQh29QsGKw32dPdzdVEI8XANcgVq5mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BhgYGBsZmRo6GxkQoAQB9HCwJ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR DETERMINING VERY LOW CAPACITIES AND SENSOR DESIGNED THEREFOR</title><source>esp@cenet</source><creator>MARKSTEINER, STEPHAN ; SCHEITER, THOMAS ; VON BASSE, PAUL-WERNER ; WILLER, JOSEF</creator><creatorcontrib>MARKSTEINER, STEPHAN ; SCHEITER, THOMAS ; VON BASSE, PAUL-WERNER ; WILLER, JOSEF</creatorcontrib><edition>7</edition><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTING ; COUNTING ; HANDLING RECORD CARRIERS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING ELECTRIC VARIABLES ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS ; TESTING</subject><creationdate>2000</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000517&amp;DB=EPODOC&amp;CC=EP&amp;NR=1000362A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25568,76551</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000517&amp;DB=EPODOC&amp;CC=EP&amp;NR=1000362A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MARKSTEINER, STEPHAN</creatorcontrib><creatorcontrib>SCHEITER, THOMAS</creatorcontrib><creatorcontrib>VON BASSE, PAUL-WERNER</creatorcontrib><creatorcontrib>WILLER, JOSEF</creatorcontrib><title>METHOD FOR DETERMINING VERY LOW CAPACITIES AND SENSOR DESIGNED THEREFOR</title><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2000</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD3dQ3x8HdRcPMPUnBxDXEN8vX08_RzVwhzDYpU8PEPV3B2DHB09gzxdA1WcPRzUQh29QsGKw32dPdzdVEI8XANcgVq5mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BhgYGBsZmRo6GxkQoAQB9HCwJ</recordid><startdate>20000517</startdate><enddate>20000517</enddate><creator>MARKSTEINER, STEPHAN</creator><creator>SCHEITER, THOMAS</creator><creator>VON BASSE, PAUL-WERNER</creator><creator>WILLER, JOSEF</creator><scope>EVB</scope></search><sort><creationdate>20000517</creationdate><title>METHOD FOR DETERMINING VERY LOW CAPACITIES AND SENSOR DESIGNED THEREFOR</title><author>MARKSTEINER, STEPHAN ; SCHEITER, THOMAS ; VON BASSE, PAUL-WERNER ; WILLER, JOSEF</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP1000362A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2000</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MARKSTEINER, STEPHAN</creatorcontrib><creatorcontrib>SCHEITER, THOMAS</creatorcontrib><creatorcontrib>VON BASSE, PAUL-WERNER</creatorcontrib><creatorcontrib>WILLER, JOSEF</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MARKSTEINER, STEPHAN</au><au>SCHEITER, THOMAS</au><au>VON BASSE, PAUL-WERNER</au><au>WILLER, JOSEF</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR DETERMINING VERY LOW CAPACITIES AND SENSOR DESIGNED THEREFOR</title><date>2000-05-17</date><risdate>2000</risdate><edition>7</edition><oa>free_for_read</oa></addata></record>
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language eng ; fre ; ger
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subjects CALCULATING
COMPUTING
COUNTING
HANDLING RECORD CARRIERS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING ELECTRIC VARIABLES
MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MEASURING MAGNETIC VARIABLES
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
TESTING
title METHOD FOR DETERMINING VERY LOW CAPACITIES AND SENSOR DESIGNED THEREFOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-16T23%3A09%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MARKSTEINER,%20STEPHAN&rft.date=2000-05-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP1000362A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true