A gas detector and its adjusting method
A metal oxide semiconductor gas sensor S is connected to a ladder resistance R, and the output voltage is subjected to logarithmic transformation at plural points on a waveform of temperature change by where R indicating the resistance of the metal oxide semiconductor, V R1 the output voltage to the...
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creator | UDAKA,TOSHIHIRO SHIOIRI,AKIRA |
description | A metal oxide semiconductor gas sensor S is connected to a ladder resistance R, and the output voltage is subjected to logarithmic transformation at plural points on a waveform of temperature change by where R indicating the resistance of the metal oxide semiconductor, V R1 the output voltage to the ladder resistance, Vc the detecting voltage, R1 the resistance of the ladder resistance, and Ln natural logarithm, respectively. Standard signals comprising logarithms of resistance values of the metal oxide semiconductor in plural concentrations and at plural points on the waveform are stored in the EEPROM, and these standard signals and logarithms obtained are compared with each other to detect the gas. |
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Standard signals comprising logarithms of resistance values of the metal oxide semiconductor in plural concentrations and at plural points on the waveform are stored in the EEPROM, and these standard signals and logarithms obtained are compared with each other to detect the gas.</description><edition>7</edition><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2001</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20010321&DB=EPODOC&CC=EP&NR=0901012A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20010321&DB=EPODOC&CC=EP&NR=0901012A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>UDAKA,TOSHIHIRO</creatorcontrib><creatorcontrib>SHIOIRI,AKIRA</creatorcontrib><title>A gas detector and its adjusting method</title><description>A metal oxide semiconductor gas sensor S is connected to a ladder resistance R, and the output voltage is subjected to logarithmic transformation at plural points on a waveform of temperature change by where R indicating the resistance of the metal oxide semiconductor, V R1 the output voltage to the ladder resistance, Vc the detecting voltage, R1 the resistance of the ladder resistance, and Ln natural logarithm, respectively. Standard signals comprising logarithms of resistance values of the metal oxide semiconductor in plural concentrations and at plural points on the waveform are stored in the EEPROM, and these standard signals and logarithms obtained are compared with each other to detect the gas.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2001</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB3VEhPLFZISS1JTS7JL1JIzEtRyCwpVkhMySotLsnMS1fITS3JyE_hYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgEGlgaGBoZGjsbGRCgBABX6Jvc</recordid><startdate>20010321</startdate><enddate>20010321</enddate><creator>UDAKA,TOSHIHIRO</creator><creator>SHIOIRI,AKIRA</creator><scope>EVB</scope></search><sort><creationdate>20010321</creationdate><title>A gas detector and its adjusting method</title><author>UDAKA,TOSHIHIRO ; SHIOIRI,AKIRA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP0901012A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2001</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>UDAKA,TOSHIHIRO</creatorcontrib><creatorcontrib>SHIOIRI,AKIRA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>UDAKA,TOSHIHIRO</au><au>SHIOIRI,AKIRA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>A gas detector and its adjusting method</title><date>2001-03-21</date><risdate>2001</risdate><abstract>A metal oxide semiconductor gas sensor S is connected to a ladder resistance R, and the output voltage is subjected to logarithmic transformation at plural points on a waveform of temperature change by where R indicating the resistance of the metal oxide semiconductor, V R1 the output voltage to the ladder resistance, Vc the detecting voltage, R1 the resistance of the ladder resistance, and Ln natural logarithm, respectively. Standard signals comprising logarithms of resistance values of the metal oxide semiconductor in plural concentrations and at plural points on the waveform are stored in the EEPROM, and these standard signals and logarithms obtained are compared with each other to detect the gas.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | A gas detector and its adjusting method |
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