PROCESS FOR DETERMINING THE THICKNESS OF A LAYER OF ELECTROCONDUCTIVE MATERIAL
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | DIMKE, REINHARD HACHTEL, HANSJOERG AUF DER HEIDE, FRANZ DOBLER, KLAUS WEBER, JOSEF BLATTERT, RICHARD |
| description | |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP0891532A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP0891532A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP0891532A13</originalsourceid><addsrcrecordid>eNrjZPALCPJ3dg0OVnDzD1JwcQ1xDfL19PP0c1cI8XAFYk9nbz-QrL-bgqOCj2OkaxCI6erj6hwC1Ofv5xLqHOIZ5qrg6wjU6enow8PAmpaYU5zKC6W5GRTcXEOcPXRTC_LjU4sLEpNT81JL4l0DDCwsDU2NjRwNjYlQAgC5GS4X</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PROCESS FOR DETERMINING THE THICKNESS OF A LAYER OF ELECTROCONDUCTIVE MATERIAL</title><source>esp@cenet</source><creator>DIMKE, REINHARD ; HACHTEL, HANSJOERG ; AUF DER HEIDE, FRANZ ; DOBLER, KLAUS ; WEBER, JOSEF ; BLATTERT, RICHARD</creator><creatorcontrib>DIMKE, REINHARD ; HACHTEL, HANSJOERG ; AUF DER HEIDE, FRANZ ; DOBLER, KLAUS ; WEBER, JOSEF ; BLATTERT, RICHARD</creatorcontrib><edition>6</edition><language>eng ; fre ; ger</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING ELECTRIC VARIABLES ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING MAGNETIC VARIABLES ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990120&DB=EPODOC&CC=EP&NR=0891532A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990120&DB=EPODOC&CC=EP&NR=0891532A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DIMKE, REINHARD</creatorcontrib><creatorcontrib>HACHTEL, HANSJOERG</creatorcontrib><creatorcontrib>AUF DER HEIDE, FRANZ</creatorcontrib><creatorcontrib>DOBLER, KLAUS</creatorcontrib><creatorcontrib>WEBER, JOSEF</creatorcontrib><creatorcontrib>BLATTERT, RICHARD</creatorcontrib><title>PROCESS FOR DETERMINING THE THICKNESS OF A LAYER OF ELECTROCONDUCTIVE MATERIAL</title><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPALCPJ3dg0OVnDzD1JwcQ1xDfL19PP0c1cI8XAFYk9nbz-QrL-bgqOCj2OkaxCI6erj6hwC1Ofv5xLqHOIZ5qrg6wjU6enow8PAmpaYU5zKC6W5GRTcXEOcPXRTC_LjU4sLEpNT81JL4l0DDCwsDU2NjRwNjYlQAgC5GS4X</recordid><startdate>19990120</startdate><enddate>19990120</enddate><creator>DIMKE, REINHARD</creator><creator>HACHTEL, HANSJOERG</creator><creator>AUF DER HEIDE, FRANZ</creator><creator>DOBLER, KLAUS</creator><creator>WEBER, JOSEF</creator><creator>BLATTERT, RICHARD</creator><scope>EVB</scope></search><sort><creationdate>19990120</creationdate><title>PROCESS FOR DETERMINING THE THICKNESS OF A LAYER OF ELECTROCONDUCTIVE MATERIAL</title><author>DIMKE, REINHARD ; HACHTEL, HANSJOERG ; AUF DER HEIDE, FRANZ ; DOBLER, KLAUS ; WEBER, JOSEF ; BLATTERT, RICHARD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP0891532A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>1999</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DIMKE, REINHARD</creatorcontrib><creatorcontrib>HACHTEL, HANSJOERG</creatorcontrib><creatorcontrib>AUF DER HEIDE, FRANZ</creatorcontrib><creatorcontrib>DOBLER, KLAUS</creatorcontrib><creatorcontrib>WEBER, JOSEF</creatorcontrib><creatorcontrib>BLATTERT, RICHARD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DIMKE, REINHARD</au><au>HACHTEL, HANSJOERG</au><au>AUF DER HEIDE, FRANZ</au><au>DOBLER, KLAUS</au><au>WEBER, JOSEF</au><au>BLATTERT, RICHARD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROCESS FOR DETERMINING THE THICKNESS OF A LAYER OF ELECTROCONDUCTIVE MATERIAL</title><date>1999-01-20</date><risdate>1999</risdate><edition>6</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP0891532A1 |
| source | esp@cenet |
| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | PROCESS FOR DETERMINING THE THICKNESS OF A LAYER OF ELECTROCONDUCTIVE MATERIAL |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-14T09%3A10%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DIMKE,%20REINHARD&rft.date=1999-01-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP0891532A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |