Semiconductor structure with abrupt doping profile
A structure and method of forming an abrupt doping profile are described. A perferred embodiment incorporates a substrate 32, a first epitaxial layer 36 of Ge less than the critical thickness and having a P or As concentration greater than 5x10 atoms/cc, and a second epitaxial layer 40 having a chan...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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