SYSTEM FOR MEASURING SURFACE FLATNESS USING SHADOW MOIRE TECHNOLOGY

SYSTEM FOR MEASURING SURFACE FLATNESS USING SHADOW MOIRE TECHNOLOGY

A system for measuring surface characteristics of an electronic interconnection component, such as a printed circuit board, by analyzing shadow moir+E,acu e+EE patterns. Printed circuit boards are carried on a continuous conveyor under a grating. For each printed circuit board, a shadow moir+E,acu e...

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Hauptverfasser: ZWEMER, DIRK, A, HASSELL, PATRICK, B
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator ZWEMER, DIRK, A
HASSELL, PATRICK, B
description A system for measuring surface characteristics of an electronic interconnection component, such as a printed circuit board, by analyzing shadow moir+E,acu e+EE patterns. Printed circuit boards are carried on a continuous conveyor under a grating. For each printed circuit board, a shadow moir+E,acu e+EE fringe pattern is created in response to a determination that the printed circuit board is properly located under a grating and within the field of view of a camera. Fringes of the shadow moir+E,acu e+EE fringe pattern are quantified over one or a multiple of analysis paths to determining if the printed circuit board is unacceptably warped, in which case a signal is generated. For each printed circuit board, multiple images can be captured and mathematically combined, by image subtraction, to produce an enhanced shadow moir+E,acu e+EE fringe pattern that is analyzed for warpage.
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language eng ; fre ; ger
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title SYSTEM FOR MEASURING SURFACE FLATNESS USING SHADOW MOIRE TECHNOLOGY
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