Method of forming an electrode structure for a semiconductor device
An electrode structure for a semiconductor device and a method for forming the electrode structure, and a mounted body including the semiconductor device are provided in which the semiconductor device can be easily connected to a circuit board with high reliability. An aluminum electrode (2) is form...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | BESSHO, YOSHIHIRO |
description | An electrode structure for a semiconductor device and a method for forming the electrode structure, and a mounted body including the semiconductor device are provided in which the semiconductor device can be easily connected to a circuit board with high reliability. An aluminum electrode (2) is formed on an IC substrate (1). A passivation film (5) is formed on the IC substrate (1) so as to cover the peripheral portion of the aluminum electrode (2). A bump electrode (3) is formed on the aluminum electrode (2) by a wire bonding method. An aluminum oxide film (4) is formed on the surface of the aluminum electrode (2) that is exposed around the bump electrode (3). A conductive adhesive (8) is applied as a bonding layer to the tip portion of the bump electrode (3) of the semiconductor device by a transfer method or a printing method. The semiconductor device is aligned in the face-down state in such a manner that the bump electrode (3) abuts on a terminal electrode (7) of a circuit board (6), and is provided on a circuit board (14). In this state, the conductive adhesive (8) is hardened. A gap between the IC substrate (1) and the circuit board (6) is filled with an insulating resin (9). |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP0753890B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP0753890B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP0753890B13</originalsourceid><addsrcrecordid>eNrjZHD2TS3JyE9RyE9TSMsvys3MS1dIzFNIzUlNLinKT0lVKC4pKk0uKS1KBUkrJCoUp-ZmJufnpQAFgfyU1LLM5FQeBta0xJziVF4ozc2g4OYa4uyhm1qQH59aXJCYnJqXWhLvGmBgbmpsYWngZGhMhBIAGp8yKg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method of forming an electrode structure for a semiconductor device</title><source>esp@cenet</source><creator>BESSHO, YOSHIHIRO</creator><creatorcontrib>BESSHO, YOSHIHIRO</creatorcontrib><description>An electrode structure for a semiconductor device and a method for forming the electrode structure, and a mounted body including the semiconductor device are provided in which the semiconductor device can be easily connected to a circuit board with high reliability. An aluminum electrode (2) is formed on an IC substrate (1). A passivation film (5) is formed on the IC substrate (1) so as to cover the peripheral portion of the aluminum electrode (2). A bump electrode (3) is formed on the aluminum electrode (2) by a wire bonding method. An aluminum oxide film (4) is formed on the surface of the aluminum electrode (2) that is exposed around the bump electrode (3). A conductive adhesive (8) is applied as a bonding layer to the tip portion of the bump electrode (3) of the semiconductor device by a transfer method or a printing method. The semiconductor device is aligned in the face-down state in such a manner that the bump electrode (3) abuts on a terminal electrode (7) of a circuit board (6), and is provided on a circuit board (14). In this state, the conductive adhesive (8) is hardened. A gap between the IC substrate (1) and the circuit board (6) is filled with an insulating resin (9).</description><edition>6</edition><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990602&DB=EPODOC&CC=EP&NR=0753890B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990602&DB=EPODOC&CC=EP&NR=0753890B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BESSHO, YOSHIHIRO</creatorcontrib><title>Method of forming an electrode structure for a semiconductor device</title><description>An electrode structure for a semiconductor device and a method for forming the electrode structure, and a mounted body including the semiconductor device are provided in which the semiconductor device can be easily connected to a circuit board with high reliability. An aluminum electrode (2) is formed on an IC substrate (1). A passivation film (5) is formed on the IC substrate (1) so as to cover the peripheral portion of the aluminum electrode (2). A bump electrode (3) is formed on the aluminum electrode (2) by a wire bonding method. An aluminum oxide film (4) is formed on the surface of the aluminum electrode (2) that is exposed around the bump electrode (3). A conductive adhesive (8) is applied as a bonding layer to the tip portion of the bump electrode (3) of the semiconductor device by a transfer method or a printing method. The semiconductor device is aligned in the face-down state in such a manner that the bump electrode (3) abuts on a terminal electrode (7) of a circuit board (6), and is provided on a circuit board (14). In this state, the conductive adhesive (8) is hardened. A gap between the IC substrate (1) and the circuit board (6) is filled with an insulating resin (9).</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD2TS3JyE9RyE9TSMsvys3MS1dIzFNIzUlNLinKT0lVKC4pKk0uKS1KBUkrJCoUp-ZmJufnpQAFgfyU1LLM5FQeBta0xJziVF4ozc2g4OYa4uyhm1qQH59aXJCYnJqXWhLvGmBgbmpsYWngZGhMhBIAGp8yKg</recordid><startdate>19990602</startdate><enddate>19990602</enddate><creator>BESSHO, YOSHIHIRO</creator><scope>EVB</scope></search><sort><creationdate>19990602</creationdate><title>Method of forming an electrode structure for a semiconductor device</title><author>BESSHO, YOSHIHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP0753890B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>1999</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>BESSHO, YOSHIHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BESSHO, YOSHIHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of forming an electrode structure for a semiconductor device</title><date>1999-06-02</date><risdate>1999</risdate><abstract>An electrode structure for a semiconductor device and a method for forming the electrode structure, and a mounted body including the semiconductor device are provided in which the semiconductor device can be easily connected to a circuit board with high reliability. An aluminum electrode (2) is formed on an IC substrate (1). A passivation film (5) is formed on the IC substrate (1) so as to cover the peripheral portion of the aluminum electrode (2). A bump electrode (3) is formed on the aluminum electrode (2) by a wire bonding method. An aluminum oxide film (4) is formed on the surface of the aluminum electrode (2) that is exposed around the bump electrode (3). A conductive adhesive (8) is applied as a bonding layer to the tip portion of the bump electrode (3) of the semiconductor device by a transfer method or a printing method. The semiconductor device is aligned in the face-down state in such a manner that the bump electrode (3) abuts on a terminal electrode (7) of a circuit board (6), and is provided on a circuit board (14). In this state, the conductive adhesive (8) is hardened. A gap between the IC substrate (1) and the circuit board (6) is filled with an insulating resin (9).</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; fre ; ger |
recordid | cdi_epo_espacenet_EP0753890B1 |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Method of forming an electrode structure for a semiconductor device |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T15%3A43%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BESSHO,%20YOSHIHIRO&rft.date=1999-06-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP0753890B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |