Integrated circuit having an on chip thermal circuit requiring only one dedicated integrated circuit pin and method of operation
An integrated circuit implements an on chip thermal circuit (12) for measuring temperature of an operating integrated circuit die (10) by requiring only one dedicated integrated circuit pin (16). A second integrated circuit pin (18) is utilized but is also connected directly connected to other circu...
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creator | LEDBETTER, WILLIAM B GAY, JAMES G |
description | An integrated circuit implements an on chip thermal circuit (12) for measuring temperature of an operating integrated circuit die (10) by requiring only one dedicated integrated circuit pin (16). A second integrated circuit pin (18) is utilized but is also connected directly connected to other circuitry (14) on the integrated circuit and is used by the other circuitry at the same time that the integrated circuit die temperature is being measured. In one form, the second integrated circuit pin is a ground terminal. Error voltages coupled to the ground terminal may be removed from the temperature calculation by an external differential amplifier (24). |
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A second integrated circuit pin (18) is utilized but is also connected directly connected to other circuitry (14) on the integrated circuit and is used by the other circuitry at the same time that the integrated circuit die temperature is being measured. In one form, the second integrated circuit pin is a ground terminal. Error voltages coupled to the ground terminal may be removed from the temperature calculation by an external differential amplifier (24).</description><edition>6</edition><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>1995</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19950531&DB=EPODOC&CC=EP&NR=0655614A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19950531&DB=EPODOC&CC=EP&NR=0655614A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEDBETTER, WILLIAM B</creatorcontrib><creatorcontrib>GAY, JAMES G</creatorcontrib><title>Integrated circuit having an on chip thermal circuit requiring only one dedicated integrated circuit pin and method of operation</title><description>An integrated circuit implements an on chip thermal circuit (12) for measuring temperature of an operating integrated circuit die (10) by requiring only one dedicated integrated circuit pin (16). A second integrated circuit pin (18) is utilized but is also connected directly connected to other circuitry (14) on the integrated circuit and is used by the other circuitry at the same time that the integrated circuit die temperature is being measured. In one form, the second integrated circuit pin is a ground terminal. Error voltages coupled to the ground terminal may be removed from the temperature calculation by an external differential amplifier (24).</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1995</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzLEKwkAQhOE0FqK-w76AYNDYi0S0s7APx90kt5DsnpeLYOejG0VsbGxmmo9_mj1OktBEk-DIcrQDJ_LmxtKQEVIh6zlQ8oidab8i4jpwfCGV9j4OyMGxfWf4txhYxpyjDsmrI61JA0bCKvNsUpu2x-Lzs4wO5WV_XCJohT4YC0GqyvNqWxTbfLPL13-QJ8q-SRg</recordid><startdate>19950531</startdate><enddate>19950531</enddate><creator>LEDBETTER, WILLIAM B</creator><creator>GAY, JAMES G</creator><scope>EVB</scope></search><sort><creationdate>19950531</creationdate><title>Integrated circuit having an on chip thermal circuit requiring only one dedicated integrated circuit pin and method of operation</title><author>LEDBETTER, WILLIAM B ; GAY, JAMES G</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP0655614A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>1995</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>LEDBETTER, WILLIAM B</creatorcontrib><creatorcontrib>GAY, JAMES G</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEDBETTER, WILLIAM B</au><au>GAY, JAMES G</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Integrated circuit having an on chip thermal circuit requiring only one dedicated integrated circuit pin and method of operation</title><date>1995-05-31</date><risdate>1995</risdate><abstract>An integrated circuit implements an on chip thermal circuit (12) for measuring temperature of an operating integrated circuit die (10) by requiring only one dedicated integrated circuit pin (16). A second integrated circuit pin (18) is utilized but is also connected directly connected to other circuitry (14) on the integrated circuit and is used by the other circuitry at the same time that the integrated circuit die temperature is being measured. In one form, the second integrated circuit pin is a ground terminal. Error voltages coupled to the ground terminal may be removed from the temperature calculation by an external differential amplifier (24).</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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language | eng ; fre ; ger |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS SEMICONDUCTOR DEVICES TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR |
title | Integrated circuit having an on chip thermal circuit requiring only one dedicated integrated circuit pin and method of operation |
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