Method for multilayer CVD processing in a single chamber
Multilayer deposition of thin films onto glass substrates to form thin film transistors can be carried out in the same chamber (120) under similar reaction conditions at high deposition rates. We have found that sequential thin layers of silicon nitride and amorphous silicon can be deposited in the...
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creator | MAYDAN, DAN LEE, ANGELA LAW, KAM S KOLLRACK, MARC MICHAEL LOU, PAMELA ROBERTSON, ROBERT |
description | Multilayer deposition of thin films onto glass substrates to form thin film transistors can be carried out in the same chamber (120) under similar reaction conditions at high deposition rates. We have found that sequential thin layers of silicon nitride and amorphous silicon can be deposited in the same chamber by chemical vapor deposition using pressure of at least 0.5 Torr and substrate temperatures of about 250-370C. Subsequently deposited different thin films can also be deposited in separate chemical vapor deposition chambers (122, 124, 126) which are part of a single multichamber vacuum system (111). |
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We have found that sequential thin layers of silicon nitride and amorphous silicon can be deposited in the same chamber by chemical vapor deposition using pressure of at least 0.5 Torr and substrate temperatures of about 250-370C. Subsequently deposited different thin films can also be deposited in separate chemical vapor deposition chambers (122, 124, 126) which are part of a single multichamber vacuum system (111).</description><edition>6</edition><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SEMICONDUCTOR DEVICES ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>1999</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990303&DB=EPODOC&CC=EP&NR=0608633B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990303&DB=EPODOC&CC=EP&NR=0608633B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MAYDAN, DAN</creatorcontrib><creatorcontrib>LEE, ANGELA</creatorcontrib><creatorcontrib>LAW, KAM S</creatorcontrib><creatorcontrib>KOLLRACK, MARC MICHAEL</creatorcontrib><creatorcontrib>LOU, PAMELA</creatorcontrib><creatorcontrib>ROBERTSON, ROBERT</creatorcontrib><title>Method for multilayer CVD processing in a single chamber</title><description>Multilayer deposition of thin films onto glass substrates to form thin film transistors can be carried out in the same chamber (120) under similar reaction conditions at high deposition rates. We have found that sequential thin layers of silicon nitride and amorphous silicon can be deposited in the same chamber by chemical vapor deposition using pressure of at least 0.5 Torr and substrate temperatures of about 250-370C. Subsequently deposited different thin films can also be deposited in separate chemical vapor deposition chambers (122, 124, 126) which are part of a single multichamber vacuum system (111).</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1999</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDwTS3JyE9RSMsvUsgtzSnJzEmsTC1ScA5zUSgoyk9OLS7OzEtXyMxTSFQAsXJSFZIzEnOTUot4GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakm8a4CBmYGFmbGxk6ExEUoAcSktUw</recordid><startdate>19990303</startdate><enddate>19990303</enddate><creator>MAYDAN, DAN</creator><creator>LEE, ANGELA</creator><creator>LAW, KAM S</creator><creator>KOLLRACK, MARC MICHAEL</creator><creator>LOU, PAMELA</creator><creator>ROBERTSON, ROBERT</creator><scope>EVB</scope></search><sort><creationdate>19990303</creationdate><title>Method for multilayer CVD processing in a single chamber</title><author>MAYDAN, DAN ; LEE, ANGELA ; LAW, KAM S ; KOLLRACK, MARC MICHAEL ; LOU, PAMELA ; ROBERTSON, ROBERT</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP0608633B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>1999</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>MAYDAN, DAN</creatorcontrib><creatorcontrib>LEE, ANGELA</creatorcontrib><creatorcontrib>LAW, KAM S</creatorcontrib><creatorcontrib>KOLLRACK, MARC MICHAEL</creatorcontrib><creatorcontrib>LOU, PAMELA</creatorcontrib><creatorcontrib>ROBERTSON, ROBERT</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MAYDAN, DAN</au><au>LEE, ANGELA</au><au>LAW, KAM S</au><au>KOLLRACK, MARC MICHAEL</au><au>LOU, PAMELA</au><au>ROBERTSON, ROBERT</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for multilayer CVD processing in a single chamber</title><date>1999-03-03</date><risdate>1999</risdate><abstract>Multilayer deposition of thin films onto glass substrates to form thin film transistors can be carried out in the same chamber (120) under similar reaction conditions at high deposition rates. We have found that sequential thin layers of silicon nitride and amorphous silicon can be deposited in the same chamber by chemical vapor deposition using pressure of at least 0.5 Torr and substrate temperatures of about 250-370C. Subsequently deposited different thin films can also be deposited in separate chemical vapor deposition chambers (122, 124, 126) which are part of a single multichamber vacuum system (111).</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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language | eng ; fre ; ger |
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subjects | BASIC ELECTRIC ELEMENTS CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL METALLURGY SEMICONDUCTOR DEVICES SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION |
title | Method for multilayer CVD processing in a single chamber |
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