OPTICAL SENSOR WITH INTERMODAL INTERFEROMETRY

An optical sensor with intermodal interferometry, using a bimodal optical fiber propagating a first mode and giving rise to a second mode coupled to the first in response to a disturbance cause by a physical or chemical quantity of which it is wished to determine the position along the optical fiber...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	KOTROTSIOS, GEORGES, PARRIAUX, OLIVIER
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS RADIATION PYROMETRY TARIFF METERING APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	KOTROTSIOS, GEORGES PARRIAUX, OLIVIER
description	An optical sensor with intermodal interferometry, using a bimodal optical fiber propagating a first mode and giving rise to a second mode coupled to the first in response to a disturbance cause by a physical or chemical quantity of which it is wished to determine the position along the optical fiber by compensating the difference in the delay time between modes at the input of the interferometer.
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP0418202A3</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP0418202A3</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP0418202A33</originalsourceid><addsrcrecordid>eNrjZND1DwjxdHb0UQh29Qv2D1II9wzxUPD0C3EN8vV3AQqDmW6uQf6-riFBkTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JN41wMDE0MLIwMjR2JgIJQChLSVy</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTICAL SENSOR WITH INTERMODAL INTERFEROMETRY</title><source>esp@cenet</source><creator>KOTROTSIOS, GEORGES ; PARRIAUX, OLIVIER</creator><creatorcontrib>KOTROTSIOS, GEORGES ; PARRIAUX, OLIVIER</creatorcontrib><description>An optical sensor with intermodal interferometry, using a bimodal optical fiber propagating a first mode and giving rise to a second mode coupled to the first in response to a disturbance cause by a physical or chemical quantity of which it is wished to determine the position along the optical fiber by compensating the difference in the delay time between modes at the input of the interferometer.</description><edition>5</edition><language>eng ; fre</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; RADIATION PYROMETRY ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>1991</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19911016&DB=EPODOC&CC=EP&NR=0418202A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19911016&DB=EPODOC&CC=EP&NR=0418202A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KOTROTSIOS, GEORGES</creatorcontrib><creatorcontrib>PARRIAUX, OLIVIER</creatorcontrib><title>OPTICAL SENSOR WITH INTERMODAL INTERFEROMETRY</title><description>An optical sensor with intermodal interferometry, using a bimodal optical fiber propagating a first mode and giving rise to a second mode coupled to the first in response to a disturbance cause by a physical or chemical quantity of which it is wished to determine the position along the optical fiber by compensating the difference in the delay time between modes at the input of the interferometer.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1991</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND1DwjxdHb0UQh29Qv2D1II9wzxUPD0C3EN8vV3AQqDmW6uQf6-riFBkTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JN41wMDE0MLIwMjR2JgIJQChLSVy</recordid><startdate>19911016</startdate><enddate>19911016</enddate><creator>KOTROTSIOS, GEORGES</creator><creator>PARRIAUX, OLIVIER</creator><scope>EVB</scope></search><sort><creationdate>19911016</creationdate><title>OPTICAL SENSOR WITH INTERMODAL INTERFEROMETRY</title><author>KOTROTSIOS, GEORGES ; PARRIAUX, OLIVIER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP0418202A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>1991</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KOTROTSIOS, GEORGES</creatorcontrib><creatorcontrib>PARRIAUX, OLIVIER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KOTROTSIOS, GEORGES</au><au>PARRIAUX, OLIVIER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTICAL SENSOR WITH INTERMODAL INTERFEROMETRY</title><date>1991-10-16</date><risdate>1991</risdate><abstract>An optical sensor with intermodal interferometry, using a bimodal optical fiber propagating a first mode and giving rise to a second mode coupled to the first in response to a disturbance cause by a physical or chemical quantity of which it is wished to determine the position along the optical fiber by compensating the difference in the delay time between modes at the input of the interferometer.</abstract><edition>5</edition><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng ; fre
recordid	cdi_epo_espacenet_EP0418202A3
source	esp@cenet
subjects	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS RADIATION PYROMETRY TARIFF METERING APPARATUS TESTING
title	OPTICAL SENSOR WITH INTERMODAL INTERFEROMETRY
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T23%3A26%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KOTROTSIOS,%20GEORGES&rft.date=1991-10-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP0418202A3%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true