Shielded capacitances standard

This invention relates to a capacitance standard (10) for use with capacitance sensitive probes (P). The standard comprises a capacitor having a pair of spaced plates (20,21) and a dielectric (25) positioned therebetween. A shield attached to one of the plates forms an enclosure around the other pla...

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1. Verfasser: DISHMAN, MICHAEL R
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creator DISHMAN, MICHAEL R
description This invention relates to a capacitance standard (10) for use with capacitance sensitive probes (P). The standard comprises a capacitor having a pair of spaced plates (20,21) and a dielectric (25) positioned therebetween. A shield attached to one of the plates forms an enclosure around the other plate to essentially shield the capacitor. The capacitance standard is therefore not affected by outside electrical fields and an accurate, reproducible capacitance value is provided.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP0382600A2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP0382600A2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP0382600A23</originalsourceid><addsrcrecordid>eNrjZJALzshMzUlJTVFITixITM4sScxLTi1WKAbSKYlFKTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrUYqCM1L7Uk3jXAwNjCyMzAwNHImAglALrNJCc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Shielded capacitances standard</title><source>esp@cenet</source><creator>DISHMAN, MICHAEL R</creator><creatorcontrib>DISHMAN, MICHAEL R</creatorcontrib><description>This invention relates to a capacitance standard (10) for use with capacitance sensitive probes (P). The standard comprises a capacitor having a pair of spaced plates (20,21) and a dielectric (25) positioned therebetween. A shield attached to one of the plates forms an enclosure around the other plate to essentially shield the capacitor. The capacitance standard is therefore not affected by outside electrical fields and an accurate, reproducible capacitance value is provided.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1990</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19900816&amp;DB=EPODOC&amp;CC=EP&amp;NR=0382600A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19900816&amp;DB=EPODOC&amp;CC=EP&amp;NR=0382600A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DISHMAN, MICHAEL R</creatorcontrib><title>Shielded capacitances standard</title><description>This invention relates to a capacitance standard (10) for use with capacitance sensitive probes (P). The standard comprises a capacitor having a pair of spaced plates (20,21) and a dielectric (25) positioned therebetween. A shield attached to one of the plates forms an enclosure around the other plate to essentially shield the capacitor. The capacitance standard is therefore not affected by outside electrical fields and an accurate, reproducible capacitance value is provided.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1990</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJALzshMzUlJTVFITixITM4sScxLTi1WKAbSKYlFKTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrUYqCM1L7Uk3jXAwNjCyMzAwNHImAglALrNJCc</recordid><startdate>19900816</startdate><enddate>19900816</enddate><creator>DISHMAN, MICHAEL R</creator><scope>EVB</scope></search><sort><creationdate>19900816</creationdate><title>Shielded capacitances standard</title><author>DISHMAN, MICHAEL R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP0382600A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>1990</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DISHMAN, MICHAEL R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DISHMAN, MICHAEL R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Shielded capacitances standard</title><date>1990-08-16</date><risdate>1990</risdate><abstract>This invention relates to a capacitance standard (10) for use with capacitance sensitive probes (P). The standard comprises a capacitor having a pair of spaced plates (20,21) and a dielectric (25) positioned therebetween. A shield attached to one of the plates forms an enclosure around the other plate to essentially shield the capacitor. The capacitance standard is therefore not affected by outside electrical fields and an accurate, reproducible capacitance value is provided.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Shielded capacitances standard
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T14%3A36%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DISHMAN,%20MICHAEL%20R&rft.date=1990-08-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP0382600A2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true