Three-dimensional displacement gauge
A three-dimensional displacement gauge (10) comprises a housing (18) and a probe (12) rotatably and slidably mounted on the housing (18). The probe (12) is slidable along a first direction (z) and has a contact member (12b) attached at one end thereof. Two emitting members (13) are mounted on the pr...
Gespeichert in:
| Hauptverfasser: | , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | YAMADA, SHIGERU KADOSAKI, MASAHIRO TANIGUCHI, KATSUJI SUGIMORI, HIROSHI TOHBO, KIHACHIRO |
| description | A three-dimensional displacement gauge (10) comprises a housing (18) and a probe (12) rotatably and slidably mounted on the housing (18). The probe (12) is slidable along a first direction (z) and has a contact member (12b) attached at one end thereof. Two emitting members (13) are mounted on the probe (12) each for emitting a light beam (L1, L2). A two-dimensional measuring member (17), such as a position sensor, is fixed to the housing (18) for detecting the light beams (L1, L2). A biasing spring (16) is provided for biasing the probe (12) towards the contact member (12b). A limit switch (19) is attached to the housing (18) for detecting whether or not the probe (12) moves in the first direction (z). The two-dimensional measuring member (17) detects the light beams (L1, L2) struck thereon so as to measure a small displacement of the contact member (12b) of the probe (12) either in the first direction (z) or in a second direction (x) perpendicular to the first direction (z). |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP0373644A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP0373644A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP0373644A13</originalsourceid><addsrcrecordid>eNrjZFAJyShKTdVNycxNzSvOzM9LzFFIySwuyElMTgWKlCikJ5amp_IwsKYl5hSn8kJpbgYFN9cQZw_d1IL8-NTiAqDivNSSeNcAA2NzYzMTE0dDYyKUAADfjiaj</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Three-dimensional displacement gauge</title><source>esp@cenet</source><creator>YAMADA, SHIGERU ; KADOSAKI, MASAHIRO ; TANIGUCHI, KATSUJI ; SUGIMORI, HIROSHI ; TOHBO, KIHACHIRO</creator><creatorcontrib>YAMADA, SHIGERU ; KADOSAKI, MASAHIRO ; TANIGUCHI, KATSUJI ; SUGIMORI, HIROSHI ; TOHBO, KIHACHIRO</creatorcontrib><description>A three-dimensional displacement gauge (10) comprises a housing (18) and a probe (12) rotatably and slidably mounted on the housing (18). The probe (12) is slidable along a first direction (z) and has a contact member (12b) attached at one end thereof. Two emitting members (13) are mounted on the probe (12) each for emitting a light beam (L1, L2). A two-dimensional measuring member (17), such as a position sensor, is fixed to the housing (18) for detecting the light beams (L1, L2). A biasing spring (16) is provided for biasing the probe (12) towards the contact member (12b). A limit switch (19) is attached to the housing (18) for detecting whether or not the probe (12) moves in the first direction (z). The two-dimensional measuring member (17) detects the light beams (L1, L2) struck thereon so as to measure a small displacement of the contact member (12b) of the probe (12) either in the first direction (z) or in a second direction (x) perpendicular to the first direction (z).</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>1990</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19900620&DB=EPODOC&CC=EP&NR=0373644A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19900620&DB=EPODOC&CC=EP&NR=0373644A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAMADA, SHIGERU</creatorcontrib><creatorcontrib>KADOSAKI, MASAHIRO</creatorcontrib><creatorcontrib>TANIGUCHI, KATSUJI</creatorcontrib><creatorcontrib>SUGIMORI, HIROSHI</creatorcontrib><creatorcontrib>TOHBO, KIHACHIRO</creatorcontrib><title>Three-dimensional displacement gauge</title><description>A three-dimensional displacement gauge (10) comprises a housing (18) and a probe (12) rotatably and slidably mounted on the housing (18). The probe (12) is slidable along a first direction (z) and has a contact member (12b) attached at one end thereof. Two emitting members (13) are mounted on the probe (12) each for emitting a light beam (L1, L2). A two-dimensional measuring member (17), such as a position sensor, is fixed to the housing (18) for detecting the light beams (L1, L2). A biasing spring (16) is provided for biasing the probe (12) towards the contact member (12b). A limit switch (19) is attached to the housing (18) for detecting whether or not the probe (12) moves in the first direction (z). The two-dimensional measuring member (17) detects the light beams (L1, L2) struck thereon so as to measure a small displacement of the contact member (12b) of the probe (12) either in the first direction (z) or in a second direction (x) perpendicular to the first direction (z).</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1990</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAJyShKTdVNycxNzSvOzM9LzFFIySwuyElMTgWKlCikJ5amp_IwsKYl5hSn8kJpbgYFN9cQZw_d1IL8-NTiAqDivNSSeNcAA2NzYzMTE0dDYyKUAADfjiaj</recordid><startdate>19900620</startdate><enddate>19900620</enddate><creator>YAMADA, SHIGERU</creator><creator>KADOSAKI, MASAHIRO</creator><creator>TANIGUCHI, KATSUJI</creator><creator>SUGIMORI, HIROSHI</creator><creator>TOHBO, KIHACHIRO</creator><scope>EVB</scope></search><sort><creationdate>19900620</creationdate><title>Three-dimensional displacement gauge</title><author>YAMADA, SHIGERU ; KADOSAKI, MASAHIRO ; TANIGUCHI, KATSUJI ; SUGIMORI, HIROSHI ; TOHBO, KIHACHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP0373644A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>1990</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YAMADA, SHIGERU</creatorcontrib><creatorcontrib>KADOSAKI, MASAHIRO</creatorcontrib><creatorcontrib>TANIGUCHI, KATSUJI</creatorcontrib><creatorcontrib>SUGIMORI, HIROSHI</creatorcontrib><creatorcontrib>TOHBO, KIHACHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAMADA, SHIGERU</au><au>KADOSAKI, MASAHIRO</au><au>TANIGUCHI, KATSUJI</au><au>SUGIMORI, HIROSHI</au><au>TOHBO, KIHACHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Three-dimensional displacement gauge</title><date>1990-06-20</date><risdate>1990</risdate><abstract>A three-dimensional displacement gauge (10) comprises a housing (18) and a probe (12) rotatably and slidably mounted on the housing (18). The probe (12) is slidable along a first direction (z) and has a contact member (12b) attached at one end thereof. Two emitting members (13) are mounted on the probe (12) each for emitting a light beam (L1, L2). A two-dimensional measuring member (17), such as a position sensor, is fixed to the housing (18) for detecting the light beams (L1, L2). A biasing spring (16) is provided for biasing the probe (12) towards the contact member (12b). A limit switch (19) is attached to the housing (18) for detecting whether or not the probe (12) moves in the first direction (z). The two-dimensional measuring member (17) detects the light beams (L1, L2) struck thereon so as to measure a small displacement of the contact member (12b) of the probe (12) either in the first direction (z) or in a second direction (x) perpendicular to the first direction (z).</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP0373644A1 |
| source | esp@cenet |
| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Three-dimensional displacement gauge |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T14%3A18%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YAMADA,%20SHIGERU&rft.date=1990-06-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP0373644A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |