APPARATUS AND METHOD FOR COLLECTING CHARGED PARTICLES

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Hauptverfasser: SANDERSON, ALLAN, RIBTON, COLIN NIGEL
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subjects APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
BASIC ELECTRIC ELEMENTS
CLADDING OR PLATING BY SOLDERING OR WELDING
CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
MACHINE TOOLS
MEASURING
METAL-WORKING NOT OTHERWISE PROVIDED FOR
PERFORMING OPERATIONS
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
SOLDERING OR UNSOLDERING
TESTING
TRANSPORTING
WELDING
WORKING BY LASER BEAM
title APPARATUS AND METHOD FOR COLLECTING CHARGED PARTICLES
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