SHIFT REGISTER FOR CHECKING AND TESTING PURPOSES

LSI circuitry conforming to LSSD rules and techniques usually requires at least a small portion of circuitry used only for check and test purposes. The disclosed circuitry meets the LSSD design rules and techniques and considerably reduces the test circuit overhead. The disclosure modifies the known...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	BLUM, ARNOLD
Format:	Patent
Sprache:	eng ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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