VORRICHTUNG UND VERFAHREN ZUR THERMISCHEN BEHANDLUNG VON HALBLEITERSUBSTRATEN

A dual resistive heater system includes a base or primary heater (120A), surrounded by a peripheral or edge heater (120B). Both resistive heaters deliver heat to a heated block, and the heaters and heated block are substantially enclosed within an insulated cavity (130A-H). The walls of the insulate...

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Hauptverfasser: JOHNSGARD, KRISTIAN E, GIVENS, JAMES A, SAVAS, STEPHEN E, DAVIET, JEAN-FRANCOIS, ATANOS, J, MATTSON, S
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creator JOHNSGARD, KRISTIAN E
GIVENS, JAMES A
SAVAS, STEPHEN E
DAVIET, JEAN-FRANCOIS
ATANOS, J
MATTSON, S
description A dual resistive heater system includes a base or primary heater (120A), surrounded by a peripheral or edge heater (120B). Both resistive heaters deliver heat to a heated block, and the heaters and heated block are substantially enclosed within an insulated cavity (130A-H). The walls of the insulated cavity may include multiple layers of insulation, and these layers may be substantially concentrically arranged. The innermost layers (130A-D) may be silicon carbide coated graphite; the outer layers (130G-H) may be opaque quartz. A vacuum spool (143) has a large conduction pathway (1010) for exhausting gases from the region of the chamber containing the resistive heaters, and a small conduction pathway (1020) for removing gases from other regions of the chamber. Temperature measurement sensors include thermocouples (610) and optical pyrometers (630), wherein the thermocouple may be used to calibrate an optical pyrometer in situ.
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Both resistive heaters deliver heat to a heated block, and the heaters and heated block are substantially enclosed within an insulated cavity (130A-H). The walls of the insulated cavity may include multiple layers of insulation, and these layers may be substantially concentrically arranged. The innermost layers (130A-D) may be silicon carbide coated graphite; the outer layers (130G-H) may be opaque quartz. A vacuum spool (143) has a large conduction pathway (1010) for exhausting gases from the region of the chamber containing the resistive heaters, and a small conduction pathway (1020) for removing gases from other regions of the chamber. Temperature measurement sensors include thermocouples (610) and optical pyrometers (630), wherein the thermocouple may be used to calibrate an optical pyrometer in situ.</abstract><oa>free_for_read</oa></addata></record>
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subjects AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE
APPARATUS THEREFOR
BASIC ELECTRIC ELEMENTS
BLASTING
CHEMISTRY
CRYSTAL GROWTH
DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS,IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KINDOF FURNACE
ELECTRIC HEATING
ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FURNACES
FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL
HEATING
KILNS
LIGHTING
MECHANICAL ENGINEERING
METALLURGY
OPEN SINTERING OR LIKE APPARATUS
OVENS
PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE
REFINING BY ZONE-MELTING OF MATERIAL
RETORTS
SEMICONDUCTOR DEVICES
SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE
SINGLE-CRYSTAL-GROWTH
UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL
WEAPONS
title VORRICHTUNG UND VERFAHREN ZUR THERMISCHEN BEHANDLUNG VON HALBLEITERSUBSTRATEN
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