Vorrichtung zur Steuerung der Wellenlänge eines Lasers

A device for monitoring the emission wavelength of a laser (10) includes a semiconductor slice or slab (14) having first (141) and second (142) opposed surfaces. The semiconductor slice (14) is exposed to the radiation at an angle such that a portion of said radiation impinges onto the first surface...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LANO, ROBERTO, DELPIANO, FRANCO, CONTARDI, CRISTIANA
Format: Patent
Sprache:ger
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Beschreibung
Zusammenfassung:A device for monitoring the emission wavelength of a laser (10) includes a semiconductor slice or slab (14) having first (141) and second (142) opposed surfaces. The semiconductor slice (14) is exposed to the radiation at an angle such that a portion of said radiation impinges onto the first surface (141) at angles in the vicinity of the Brewster angle for the first surface (141). The radiation is thus refracted into the semiconductor slice (14) and caused to propagate towards the second surface (142) of the semiconductor slice (14). A wavelength selective filter (15) is arranged at said second surface (142) having associated a photodetector (11) to generate a signal (110) indicative of the wavelength of the radiation.