NUKLEARES MESSGERÄT ZUR BESTIMMUNG DER DICHTE DÜNNER LAGEN

The present invention provides an improved thin layer nuclear density gauge comprising a gauge housing having a vertical cavity therethrough and a base, a first radiation detector located at a first position within said housing and adjacent to said base of said housing, a second radiation detector l...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: DEP, WEWAGE H, TROXLER, ROBERT E, EAGAN, JOHN T, JORDAN, ALFRED W
Format: Patent
Sprache:ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator DEP, WEWAGE H
TROXLER, ROBERT E
EAGAN, JOHN T
JORDAN, ALFRED W
description The present invention provides an improved thin layer nuclear density gauge comprising a gauge housing having a vertical cavity therethrough and a base, a first radiation detector located at a first position within said housing and adjacent to said base of said housing, a second radiation detector located at a second position within said housing and adjacent to said base of said housing, a vertically moveable source rod extending into said cavity of said gauge housing, a radiation source operatively positioned within a distal end of said source rod, at least one bearing operatively positioned to guide said source rod within said cavity, and means for vertically extending and retracting said source rod to a plurality of predetermined source rod positions so as to change the spatial relationship between said radiation source and said first and second radiation detectors. The source rod has a maximum radial movement of less than about 0.003 inch at each predetermined position. The present invention also provides a gauge with an improved radiation shield assembly comprising a sliding block operatively positioned to move laterally between said first position and said second position, a spring engaging said sliding block and biasing said sliding block into said first position, and a fixed block, said fixed block including a track engaging said sliding block and guiding movement of said sliding block.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_DE60036200TT2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>DE60036200TT2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_DE60036200TT23</originalsourceid><addsrcrecordid>eNrjZLDxC_X2cXUMcg1W8HUNDnZ3DTrcEqIQFRqk4OQaHOLp6xvq567g4hqk4OLp7BHiquByeI6fH5Dr4-ju6sfDwJqWmFOcyguluRmU3FxDnD10Uwvy41OLCxKTU_NSS-JdXM0MDIzNjAwMQkKMjIlSBAAcKCvJ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>NUKLEARES MESSGERÄT ZUR BESTIMMUNG DER DICHTE DÜNNER LAGEN</title><source>esp@cenet</source><creator>DEP, WEWAGE H ; TROXLER, ROBERT E ; EAGAN, JOHN T ; JORDAN, ALFRED W</creator><creatorcontrib>DEP, WEWAGE H ; TROXLER, ROBERT E ; EAGAN, JOHN T ; JORDAN, ALFRED W</creatorcontrib><description>The present invention provides an improved thin layer nuclear density gauge comprising a gauge housing having a vertical cavity therethrough and a base, a first radiation detector located at a first position within said housing and adjacent to said base of said housing, a second radiation detector located at a second position within said housing and adjacent to said base of said housing, a vertically moveable source rod extending into said cavity of said gauge housing, a radiation source operatively positioned within a distal end of said source rod, at least one bearing operatively positioned to guide said source rod within said cavity, and means for vertically extending and retracting said source rod to a plurality of predetermined source rod positions so as to change the spatial relationship between said radiation source and said first and second radiation detectors. The source rod has a maximum radial movement of less than about 0.003 inch at each predetermined position. The present invention also provides a gauge with an improved radiation shield assembly comprising a sliding block operatively positioned to move laterally between said first position and said second position, a spring engaging said sliding block and biasing said sliding block into said first position, and a fixed block, said fixed block including a track engaging said sliding block and guiding movement of said sliding block.</description><language>ger</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080521&amp;DB=EPODOC&amp;CC=DE&amp;NR=60036200T2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080521&amp;DB=EPODOC&amp;CC=DE&amp;NR=60036200T2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DEP, WEWAGE H</creatorcontrib><creatorcontrib>TROXLER, ROBERT E</creatorcontrib><creatorcontrib>EAGAN, JOHN T</creatorcontrib><creatorcontrib>JORDAN, ALFRED W</creatorcontrib><title>NUKLEARES MESSGERÄT ZUR BESTIMMUNG DER DICHTE DÜNNER LAGEN</title><description>The present invention provides an improved thin layer nuclear density gauge comprising a gauge housing having a vertical cavity therethrough and a base, a first radiation detector located at a first position within said housing and adjacent to said base of said housing, a second radiation detector located at a second position within said housing and adjacent to said base of said housing, a vertically moveable source rod extending into said cavity of said gauge housing, a radiation source operatively positioned within a distal end of said source rod, at least one bearing operatively positioned to guide said source rod within said cavity, and means for vertically extending and retracting said source rod to a plurality of predetermined source rod positions so as to change the spatial relationship between said radiation source and said first and second radiation detectors. The source rod has a maximum radial movement of less than about 0.003 inch at each predetermined position. The present invention also provides a gauge with an improved radiation shield assembly comprising a sliding block operatively positioned to move laterally between said first position and said second position, a spring engaging said sliding block and biasing said sliding block into said first position, and a fixed block, said fixed block including a track engaging said sliding block and guiding movement of said sliding block.</description><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>SCANNING-PROBE TECHNIQUES OR APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDxC_X2cXUMcg1W8HUNDnZ3DTrcEqIQFRqk4OQaHOLp6xvq567g4hqk4OLp7BHiquByeI6fH5Dr4-ju6sfDwJqWmFOcyguluRmU3FxDnD10Uwvy41OLCxKTU_NSS-JdXM0MDIzNjAwMQkKMjIlSBAAcKCvJ</recordid><startdate>20080521</startdate><enddate>20080521</enddate><creator>DEP, WEWAGE H</creator><creator>TROXLER, ROBERT E</creator><creator>EAGAN, JOHN T</creator><creator>JORDAN, ALFRED W</creator><scope>EVB</scope></search><sort><creationdate>20080521</creationdate><title>NUKLEARES MESSGERÄT ZUR BESTIMMUNG DER DICHTE DÜNNER LAGEN</title><author>DEP, WEWAGE H ; TROXLER, ROBERT E ; EAGAN, JOHN T ; JORDAN, ALFRED W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DE60036200TT23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>2008</creationdate><topic>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>SCANNING-PROBE TECHNIQUES OR APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DEP, WEWAGE H</creatorcontrib><creatorcontrib>TROXLER, ROBERT E</creatorcontrib><creatorcontrib>EAGAN, JOHN T</creatorcontrib><creatorcontrib>JORDAN, ALFRED W</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DEP, WEWAGE H</au><au>TROXLER, ROBERT E</au><au>EAGAN, JOHN T</au><au>JORDAN, ALFRED W</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>NUKLEARES MESSGERÄT ZUR BESTIMMUNG DER DICHTE DÜNNER LAGEN</title><date>2008-05-21</date><risdate>2008</risdate><abstract>The present invention provides an improved thin layer nuclear density gauge comprising a gauge housing having a vertical cavity therethrough and a base, a first radiation detector located at a first position within said housing and adjacent to said base of said housing, a second radiation detector located at a second position within said housing and adjacent to said base of said housing, a vertically moveable source rod extending into said cavity of said gauge housing, a radiation source operatively positioned within a distal end of said source rod, at least one bearing operatively positioned to guide said source rod within said cavity, and means for vertically extending and retracting said source rod to a plurality of predetermined source rod positions so as to change the spatial relationship between said radiation source and said first and second radiation detectors. The source rod has a maximum radial movement of less than about 0.003 inch at each predetermined position. The present invention also provides a gauge with an improved radiation shield assembly comprising a sliding block operatively positioned to move laterally between said first position and said second position, a spring engaging said sliding block and biasing said sliding block into said first position, and a fixed block, said fixed block including a track engaging said sliding block and guiding movement of said sliding block.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language ger
recordid cdi_epo_espacenet_DE60036200TT2
source esp@cenet
subjects APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
title NUKLEARES MESSGERÄT ZUR BESTIMMUNG DER DICHTE DÜNNER LAGEN
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T09%3A55%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DEP,%20WEWAGE%20H&rft.date=2008-05-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EDE60036200TT2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true