DE3838014

In piecoelectric measuring elements comprising two or more crystal elements that are jointly subject to the mechanical variable to be measured and are provided with electrically conductive electrodes on opposite surfaces located essentially normal to the electric (x) axes of these crystal elements,...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	KREMPL, PETER W, ENGEL, GUENTER. DR., LEITRING, AT, LIST, HELMUT., GRAZ, AT
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRICITY
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	KREMPL, PETER W ENGEL, GUENTER. DR., LEITRING, AT LIST, HELMUT., GRAZ, AT
description	In piecoelectric measuring elements comprising two or more crystal elements that are jointly subject to the mechanical variable to be measured and are provided with electrically conductive electrodes on opposite surfaces located essentially normal to the electric (x) axes of these crystal elements, disadvantages arising from shearing stresses can be prevented by using crystal elements (2) from crystals of point group 32, in which exist two opposite types of enantiomorphism, l and r, in which part of the crystal elements used belong to one of the two enantiomorphic types l or r, and have one of the two absolute orientations of the x-axis, alpha 1 or alpha 2, while the remaining crystal elements belong to the opposite enantiomorphic type and have the opposite orientation of the x-axis.
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_DE3838014C2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>DE3838014C2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_DE3838014C23</originalsourceid><addsrcrecordid>eNrjZOB0cTW2MLYwMDThYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxcPXORsZEKAEAzNIacA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DE3838014</title><source>esp@cenet</source><creator>KREMPL, PETER W ; ENGEL, GUENTER. DR., LEITRING, AT ; LIST, HELMUT., GRAZ, AT</creator><creatorcontrib>KREMPL, PETER W ; ENGEL, GUENTER. DR., LEITRING, AT ; LIST, HELMUT., GRAZ, AT</creatorcontrib><description>In piecoelectric measuring elements comprising two or more crystal elements that are jointly subject to the mechanical variable to be measured and are provided with electrically conductive electrodes on opposite surfaces located essentially normal to the electric (x) axes of these crystal elements, disadvantages arising from shearing stresses can be prevented by using crystal elements (2) from crystals of point group 32, in which exist two opposite types of enantiomorphism, l and r, in which part of the crystal elements used belong to one of the two enantiomorphic types l or r, and have one of the two absolute orientations of the x-axis, alpha 1 or alpha 2, while the remaining crystal elements belong to the opposite enantiomorphic type and have the opposite orientation of the x-axis.</description><language>eng</language><subject>ELECTRICITY</subject><creationdate>1990</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19900613&DB=EPODOC&CC=DE&NR=3838014C2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19900613&DB=EPODOC&CC=DE&NR=3838014C2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KREMPL, PETER W</creatorcontrib><creatorcontrib>ENGEL, GUENTER. DR., LEITRING, AT</creatorcontrib><creatorcontrib>LIST, HELMUT., GRAZ, AT</creatorcontrib><title>DE3838014</title><description>In piecoelectric measuring elements comprising two or more crystal elements that are jointly subject to the mechanical variable to be measured and are provided with electrically conductive electrodes on opposite surfaces located essentially normal to the electric (x) axes of these crystal elements, disadvantages arising from shearing stresses can be prevented by using crystal elements (2) from crystals of point group 32, in which exist two opposite types of enantiomorphism, l and r, in which part of the crystal elements used belong to one of the two enantiomorphic types l or r, and have one of the two absolute orientations of the x-axis, alpha 1 or alpha 2, while the remaining crystal elements belong to the opposite enantiomorphic type and have the opposite orientation of the x-axis.</description><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1990</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOB0cTW2MLYwMDThYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxcPXORsZEKAEAzNIacA</recordid><startdate>19900613</startdate><enddate>19900613</enddate><creator>KREMPL, PETER W</creator><creator>ENGEL, GUENTER. DR., LEITRING, AT</creator><creator>LIST, HELMUT., GRAZ, AT</creator><scope>EVB</scope></search><sort><creationdate>19900613</creationdate><title>DE3838014</title><author>KREMPL, PETER W ; ENGEL, GUENTER. DR., LEITRING, AT ; LIST, HELMUT., GRAZ, AT</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DE3838014C23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1990</creationdate><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>KREMPL, PETER W</creatorcontrib><creatorcontrib>ENGEL, GUENTER. DR., LEITRING, AT</creatorcontrib><creatorcontrib>LIST, HELMUT., GRAZ, AT</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KREMPL, PETER W</au><au>ENGEL, GUENTER. DR., LEITRING, AT</au><au>LIST, HELMUT., GRAZ, AT</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DE3838014</title><date>1990-06-13</date><risdate>1990</risdate><abstract>In piecoelectric measuring elements comprising two or more crystal elements that are jointly subject to the mechanical variable to be measured and are provided with electrically conductive electrodes on opposite surfaces located essentially normal to the electric (x) axes of these crystal elements, disadvantages arising from shearing stresses can be prevented by using crystal elements (2) from crystals of point group 32, in which exist two opposite types of enantiomorphism, l and r, in which part of the crystal elements used belong to one of the two enantiomorphic types l or r, and have one of the two absolute orientations of the x-axis, alpha 1 or alpha 2, while the remaining crystal elements belong to the opposite enantiomorphic type and have the opposite orientation of the x-axis.</abstract><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng
recordid	cdi_epo_espacenet_DE3838014C2
source	esp@cenet
subjects	ELECTRICITY
title	DE3838014
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T08%3A14%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KREMPL,%20PETER%20W&rft.date=1990-06-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EDE3838014C2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true