Verfahren und Gerät zur Gasanalyse

Verfahren und Gerät zur Gasanalyse

Gas analysis apparatus comprises a radiation source (13) arranged to transmit radiation through a gas (12) to be analysed to a radiation sensor (32). Datum means (50-60) intercepts the radiation and transmits it to the sensor at a reference or datum value. The datum means comprises a mirror to refle...

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1. Verfasser: HUTCHINSON, ROBIN JOHN, PETERBOROUGH CAMBRIDGESHIRE PE1 2QA, GB
Format: Patent
Sprache:ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator HUTCHINSON, ROBIN JOHN, PETERBOROUGH CAMBRIDGESHIRE PE1 2QA, GB
description Gas analysis apparatus comprises a radiation source (13) arranged to transmit radiation through a gas (12) to be analysed to a radiation sensor (32). Datum means (50-60) intercepts the radiation and transmits it to the sensor at a reference or datum value. The datum means comprises a mirror to reflect the radiation directly to the sensor thereby providing a zero absprption datum point. The datum means may also comprise one or more gas cells (54, 56,58) containing a high concentration of the gas to be analysed and thereby giving a high scale value datum point. The mirror and gas cells are mounted on a datum wheel (20) which is continuously rotated . Infra-red radiation from a source (13) is transmitted at two frequencies chosen for each gas to be analysed , by virtue of a rotary filter wheel 16 having pairs of filter discs (M1,R1) and (M2,R2) and (M3,R3).
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Verfahren und Gerät zur Gasanalyse
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