DETEKTOROPTIK, INSBESONDERE ZUR VERWENDUNG BEI DER FEHLERPRUEFUNG TEXTILER FLAECHENGEBILDE

First and second pairs of mirrors are oriented to intercept first and second regions respectively of a diffraction pattern and deflect these regions to individual detectors so that simultaneous analysis of the regions of the diffraction pattern can be carried out. The pairs of mirrors can be spaced...

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Bibliographische Detailangaben

1. Verfasser:	MICHAEL FOMENKO,SERGEI
Format:	Patent
Sprache:	ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
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