VORRICHTUNG ZUR ZERSTOERUNGSFREIEN UNTERSUCHUNG VON STOFFEN, BESONDERS VON HETEROGENEN OBERFLAECHEN, MITTELS BESTRAHLUNG
The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such a...
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creator | MARCEL, DELHAYE,MICHEL CLEMENT DHAMELINCOURT,PAUL ANDRE ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE |
description | The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample. Apparatus embodying the invention permits mapping, by micrographic images, of the components of geological samples, composite materials, plastic materials, biological samples, microscopic preparations and the like, by isolating in the Raman spectrum the radiations characterizing the components. |
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The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample. Apparatus embodying the invention permits mapping, by micrographic images, of the components of geological samples, composite materials, plastic materials, biological samples, microscopic preparations and the like, by isolating in the Raman spectrum the radiations characterizing the components.</description><edition>2</edition><language>ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1975</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19750605&DB=EPODOC&CC=DE&NR=2456452A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19750605&DB=EPODOC&CC=DE&NR=2456452A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MARCEL, DELHAYE,MICHEL</creatorcontrib><creatorcontrib>CLEMENT DHAMELINCOURT,PAUL ANDRE</creatorcontrib><creatorcontrib>ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE</creatorcontrib><title>VORRICHTUNG ZUR ZERSTOERUNGSFREIEN UNTERSUCHUNG VON STOFFEN, BESONDERS VON HETEROGENEN OBERFLAECHEN, MITTELS BESTRAHLUNG</title><description>The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. 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The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample. Apparatus embodying the invention permits mapping, by micrographic images, of the components of geological samples, composite materials, plastic materials, biological samples, microscopic preparations and the like, by isolating in the Raman spectrum the radiations characterizing the components.</abstract><edition>2</edition><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | VORRICHTUNG ZUR ZERSTOERUNGSFREIEN UNTERSUCHUNG VON STOFFEN, BESONDERS VON HETEROGENEN OBERFLAECHEN, MITTELS BESTRAHLUNG |
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