VORRICHTUNG ZUR ZERSTOERUNGSFREIEN UNTERSUCHUNG VON STOFFEN, BESONDERS VON HETEROGENEN OBERFLAECHEN, MITTELS BESTRAHLUNG

The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MARCEL, DELHAYE,MICHEL, CLEMENT DHAMELINCOURT,PAUL ANDRE, ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE
Format: Patent
Sprache:ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator MARCEL, DELHAYE,MICHEL
CLEMENT DHAMELINCOURT,PAUL ANDRE
ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE
description The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample. Apparatus embodying the invention permits mapping, by micrographic images, of the components of geological samples, composite materials, plastic materials, biological samples, microscopic preparations and the like, by isolating in the Raman spectrum the radiations characterizing the components.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_DE2456452A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>DE2456452A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_DE2456452A13</originalsourceid><addsrcrecordid>eNqNzLEOgkAMBmAWB6O-wz2ADiK4w9HjSLCX9HoMLISYczJKgoOPbzE-gFPT___adfLuHFGjLQesVR9I9UCeHZDs3hA0gCogSxi0XUznUAkwBnCvSvAOKym_sQVxrgaUG1cCmbYAbRd3aZih9YtnKmwrj7bJ6jbe57j7zU2iDLC2hzg9hzhP4zU-4muoIM3yc5anxfH0B_kA7jQ6rQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>VORRICHTUNG ZUR ZERSTOERUNGSFREIEN UNTERSUCHUNG VON STOFFEN, BESONDERS VON HETEROGENEN OBERFLAECHEN, MITTELS BESTRAHLUNG</title><source>esp@cenet</source><creator>MARCEL, DELHAYE,MICHEL ; CLEMENT DHAMELINCOURT,PAUL ANDRE ; ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE</creator><creatorcontrib>MARCEL, DELHAYE,MICHEL ; CLEMENT DHAMELINCOURT,PAUL ANDRE ; ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE</creatorcontrib><description>The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample. Apparatus embodying the invention permits mapping, by micrographic images, of the components of geological samples, composite materials, plastic materials, biological samples, microscopic preparations and the like, by isolating in the Raman spectrum the radiations characterizing the components.</description><edition>2</edition><language>ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1975</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19750605&amp;DB=EPODOC&amp;CC=DE&amp;NR=2456452A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19750605&amp;DB=EPODOC&amp;CC=DE&amp;NR=2456452A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MARCEL, DELHAYE,MICHEL</creatorcontrib><creatorcontrib>CLEMENT DHAMELINCOURT,PAUL ANDRE</creatorcontrib><creatorcontrib>ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE</creatorcontrib><title>VORRICHTUNG ZUR ZERSTOERUNGSFREIEN UNTERSUCHUNG VON STOFFEN, BESONDERS VON HETEROGENEN OBERFLAECHEN, MITTELS BESTRAHLUNG</title><description>The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample. Apparatus embodying the invention permits mapping, by micrographic images, of the components of geological samples, composite materials, plastic materials, biological samples, microscopic preparations and the like, by isolating in the Raman spectrum the radiations characterizing the components.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1975</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzLEOgkAMBmAWB6O-wz2ADiK4w9HjSLCX9HoMLISYczJKgoOPbzE-gFPT___adfLuHFGjLQesVR9I9UCeHZDs3hA0gCogSxi0XUznUAkwBnCvSvAOKym_sQVxrgaUG1cCmbYAbRd3aZih9YtnKmwrj7bJ6jbe57j7zU2iDLC2hzg9hzhP4zU-4muoIM3yc5anxfH0B_kA7jQ6rQ</recordid><startdate>19750605</startdate><enddate>19750605</enddate><creator>MARCEL, DELHAYE,MICHEL</creator><creator>CLEMENT DHAMELINCOURT,PAUL ANDRE</creator><creator>ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE</creator><scope>EVB</scope></search><sort><creationdate>19750605</creationdate><title>VORRICHTUNG ZUR ZERSTOERUNGSFREIEN UNTERSUCHUNG VON STOFFEN, BESONDERS VON HETEROGENEN OBERFLAECHEN, MITTELS BESTRAHLUNG</title><author>MARCEL, DELHAYE,MICHEL ; CLEMENT DHAMELINCOURT,PAUL ANDRE ; ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DE2456452A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>1975</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MARCEL, DELHAYE,MICHEL</creatorcontrib><creatorcontrib>CLEMENT DHAMELINCOURT,PAUL ANDRE</creatorcontrib><creatorcontrib>ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MARCEL, DELHAYE,MICHEL</au><au>CLEMENT DHAMELINCOURT,PAUL ANDRE</au><au>ALEXANDRE, MOSCHETTO,YVES JEAN-MARIE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>VORRICHTUNG ZUR ZERSTOERUNGSFREIEN UNTERSUCHUNG VON STOFFEN, BESONDERS VON HETEROGENEN OBERFLAECHEN, MITTELS BESTRAHLUNG</title><date>1975-06-05</date><risdate>1975</risdate><abstract>The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample. Apparatus embodying the invention permits mapping, by micrographic images, of the components of geological samples, composite materials, plastic materials, biological samples, microscopic preparations and the like, by isolating in the Raman spectrum the radiations characterizing the components.</abstract><edition>2</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language ger
recordid cdi_epo_espacenet_DE2456452A1
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title VORRICHTUNG ZUR ZERSTOERUNGSFREIEN UNTERSUCHUNG VON STOFFEN, BESONDERS VON HETEROGENEN OBERFLAECHEN, MITTELS BESTRAHLUNG
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T15%3A57%3A03IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MARCEL,%20DELHAYE,MICHEL&rft.date=1975-06-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EDE2456452A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true