VERFAHREN UND VORRICHTUNG ZUM ABTASTEN DES PROFILS VON BLECHEN ODER PLATTEN

VERFAHREN UND VORRICHTUNG ZUM ABTASTEN DES PROFILS VON BLECHEN ODER PLATTEN

A method for sensing the profile of a sheet or plate material, in which the thickness of a sheet or plate material is measured by measuring the penetration damping amount of radiation (decrease of radiation due to penetration) within the sheet or plate material, wherein a radiation generating part o...

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Hauptverfasser: UCHIDA, YUKIO, MURATA, YUUJI, MASHIKO, YOSHINORI, MATSUMOTO, MITSURU
Format: Patent
Sprache:ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator UCHIDA, YUKIO
MURATA, YUUJI
MASHIKO, YOSHINORI
MATSUMOTO, MITSURU
description A method for sensing the profile of a sheet or plate material, in which the thickness of a sheet or plate material is measured by measuring the penetration damping amount of radiation (decrease of radiation due to penetration) within the sheet or plate material, wherein a radiation generating part only is made to scan the material in its crosswise direction while a radiation detector is fixed in place in such a manner as to extend for the entire width of the sheet or plate material corresponding to the radiation generating part, thus sensing the profile of the material.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_DE2263592A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>DE2263592A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_DE2263592A13</originalsourceid><addsrcrecordid>eNrjZPAOcw1yc_QIcvVTCPVzUQjzDwrydPYICfVzV4gK9VVwdApxDA4BSrq4BisEBPm7efoEAxX5KTj5uDp7AMX9XVyDFAJ8HEOAingYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbyLq5GRmbGppZGjoTERSgBGuS1O</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>VERFAHREN UND VORRICHTUNG ZUM ABTASTEN DES PROFILS VON BLECHEN ODER PLATTEN</title><source>esp@cenet</source><creator>UCHIDA, YUKIO ; MURATA, YUUJI ; MASHIKO, YOSHINORI ; MATSUMOTO, MITSURU</creator><creatorcontrib>UCHIDA, YUKIO ; MURATA, YUUJI ; MASHIKO, YOSHINORI ; MATSUMOTO, MITSURU</creatorcontrib><description>A method for sensing the profile of a sheet or plate material, in which the thickness of a sheet or plate material is measured by measuring the penetration damping amount of radiation (decrease of radiation due to penetration) within the sheet or plate material, wherein a radiation generating part only is made to scan the material in its crosswise direction while a radiation detector is fixed in place in such a manner as to extend for the entire width of the sheet or plate material corresponding to the radiation generating part, thus sensing the profile of the material.</description><edition>1</edition><language>ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>1973</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19730712&amp;DB=EPODOC&amp;CC=DE&amp;NR=2263592A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19730712&amp;DB=EPODOC&amp;CC=DE&amp;NR=2263592A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>UCHIDA, YUKIO</creatorcontrib><creatorcontrib>MURATA, YUUJI</creatorcontrib><creatorcontrib>MASHIKO, YOSHINORI</creatorcontrib><creatorcontrib>MATSUMOTO, MITSURU</creatorcontrib><title>VERFAHREN UND VORRICHTUNG ZUM ABTASTEN DES PROFILS VON BLECHEN ODER PLATTEN</title><description>A method for sensing the profile of a sheet or plate material, in which the thickness of a sheet or plate material is measured by measuring the penetration damping amount of radiation (decrease of radiation due to penetration) within the sheet or plate material, wherein a radiation generating part only is made to scan the material in its crosswise direction while a radiation detector is fixed in place in such a manner as to extend for the entire width of the sheet or plate material corresponding to the radiation generating part, thus sensing the profile of the material.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1973</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAOcw1yc_QIcvVTCPVzUQjzDwrydPYICfVzV4gK9VVwdApxDA4BSrq4BisEBPm7efoEAxX5KTj5uDp7AMX9XVyDFAJ8HEOAingYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbyLq5GRmbGppZGjoTERSgBGuS1O</recordid><startdate>19730712</startdate><enddate>19730712</enddate><creator>UCHIDA, YUKIO</creator><creator>MURATA, YUUJI</creator><creator>MASHIKO, YOSHINORI</creator><creator>MATSUMOTO, MITSURU</creator><scope>EVB</scope></search><sort><creationdate>19730712</creationdate><title>VERFAHREN UND VORRICHTUNG ZUM ABTASTEN DES PROFILS VON BLECHEN ODER PLATTEN</title><author>UCHIDA, YUKIO ; MURATA, YUUJI ; MASHIKO, YOSHINORI ; MATSUMOTO, MITSURU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DE2263592A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>1973</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>UCHIDA, YUKIO</creatorcontrib><creatorcontrib>MURATA, YUUJI</creatorcontrib><creatorcontrib>MASHIKO, YOSHINORI</creatorcontrib><creatorcontrib>MATSUMOTO, MITSURU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>UCHIDA, YUKIO</au><au>MURATA, YUUJI</au><au>MASHIKO, YOSHINORI</au><au>MATSUMOTO, MITSURU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>VERFAHREN UND VORRICHTUNG ZUM ABTASTEN DES PROFILS VON BLECHEN ODER PLATTEN</title><date>1973-07-12</date><risdate>1973</risdate><abstract>A method for sensing the profile of a sheet or plate material, in which the thickness of a sheet or plate material is measured by measuring the penetration damping amount of radiation (decrease of radiation due to penetration) within the sheet or plate material, wherein a radiation generating part only is made to scan the material in its crosswise direction while a radiation detector is fixed in place in such a manner as to extend for the entire width of the sheet or plate material corresponding to the radiation generating part, thus sensing the profile of the material.</abstract><edition>1</edition><oa>free_for_read</oa></addata></record>
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source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title VERFAHREN UND VORRICHTUNG ZUM ABTASTEN DES PROFILS VON BLECHEN ODER PLATTEN
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T10%3A18%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=UCHIDA,%20YUKIO&rft.date=1973-07-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EDE2263592A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true