Luminescence measurement device
The measuring device includes an, especially as a photo-multiplier formed, light detector (10), detecting a light incidenting on an aperture (36) of an input mask (18), and a positioning arrangement (14, 14') for the alignment of a test disk with respect to the input mask. The test disk include...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | TRUMP, MARTIN, 75305 NEUENBUERG, DE EPPLER, JOERG, 75210 KELTERN, DE LEISTNER, HERMANN, 75217 BIRKENFELD, DE |
description | The measuring device includes an, especially as a photo-multiplier formed, light detector (10), detecting a light incidenting on an aperture (36) of an input mask (18), and a positioning arrangement (14, 14') for the alignment of a test disk with respect to the input mask. The test disk includes a number of test chambers (20) which are preferably arranged in a matrix, and which comprises respectively an upper measuring aperture (24), whereby respectively one of the test chambers (20) is arrangement in a measuring position of the input mask aperture. A cross screening (42) engages with the test disk, aligns with the measuring aperture of the test chamber located in the measuring position, and separates it from the measuring apertures of the adjacent test chambers. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_DE19704732A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>DE19704732A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_DE19704732A13</originalsourceid><addsrcrecordid>eNrjZJD3Kc3NzEstTk7NS05VyE1NLC4tSs1NzStRSEkty0xO5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFiUCNqSXxLq6GluYGJubGRo6GxsSoAQBKISUr</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Luminescence measurement device</title><source>esp@cenet</source><creator>TRUMP, MARTIN, 75305 NEUENBUERG, DE ; EPPLER, JOERG, 75210 KELTERN, DE ; LEISTNER, HERMANN, 75217 BIRKENFELD, DE</creator><creatorcontrib>TRUMP, MARTIN, 75305 NEUENBUERG, DE ; EPPLER, JOERG, 75210 KELTERN, DE ; LEISTNER, HERMANN, 75217 BIRKENFELD, DE</creatorcontrib><description>The measuring device includes an, especially as a photo-multiplier formed, light detector (10), detecting a light incidenting on an aperture (36) of an input mask (18), and a positioning arrangement (14, 14') for the alignment of a test disk with respect to the input mask. The test disk includes a number of test chambers (20) which are preferably arranged in a matrix, and which comprises respectively an upper measuring aperture (24), whereby respectively one of the test chambers (20) is arrangement in a measuring position of the input mask aperture. A cross screening (42) engages with the test disk, aligns with the measuring aperture of the test chamber located in the measuring position, and separates it from the measuring apertures of the adjacent test chambers.</description><edition>6</edition><language>eng ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1998</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19980813&DB=EPODOC&CC=DE&NR=19704732A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19980813&DB=EPODOC&CC=DE&NR=19704732A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TRUMP, MARTIN, 75305 NEUENBUERG, DE</creatorcontrib><creatorcontrib>EPPLER, JOERG, 75210 KELTERN, DE</creatorcontrib><creatorcontrib>LEISTNER, HERMANN, 75217 BIRKENFELD, DE</creatorcontrib><title>Luminescence measurement device</title><description>The measuring device includes an, especially as a photo-multiplier formed, light detector (10), detecting a light incidenting on an aperture (36) of an input mask (18), and a positioning arrangement (14, 14') for the alignment of a test disk with respect to the input mask. The test disk includes a number of test chambers (20) which are preferably arranged in a matrix, and which comprises respectively an upper measuring aperture (24), whereby respectively one of the test chambers (20) is arrangement in a measuring position of the input mask aperture. A cross screening (42) engages with the test disk, aligns with the measuring aperture of the test chamber located in the measuring position, and separates it from the measuring apertures of the adjacent test chambers.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1998</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD3Kc3NzEstTk7NS05VyE1NLC4tSs1NzStRSEkty0xO5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFiUCNqSXxLq6GluYGJubGRo6GxsSoAQBKISUr</recordid><startdate>19980813</startdate><enddate>19980813</enddate><creator>TRUMP, MARTIN, 75305 NEUENBUERG, DE</creator><creator>EPPLER, JOERG, 75210 KELTERN, DE</creator><creator>LEISTNER, HERMANN, 75217 BIRKENFELD, DE</creator><scope>EVB</scope></search><sort><creationdate>19980813</creationdate><title>Luminescence measurement device</title><author>TRUMP, MARTIN, 75305 NEUENBUERG, DE ; EPPLER, JOERG, 75210 KELTERN, DE ; LEISTNER, HERMANN, 75217 BIRKENFELD, DE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DE19704732A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; ger</language><creationdate>1998</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TRUMP, MARTIN, 75305 NEUENBUERG, DE</creatorcontrib><creatorcontrib>EPPLER, JOERG, 75210 KELTERN, DE</creatorcontrib><creatorcontrib>LEISTNER, HERMANN, 75217 BIRKENFELD, DE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TRUMP, MARTIN, 75305 NEUENBUERG, DE</au><au>EPPLER, JOERG, 75210 KELTERN, DE</au><au>LEISTNER, HERMANN, 75217 BIRKENFELD, DE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Luminescence measurement device</title><date>1998-08-13</date><risdate>1998</risdate><abstract>The measuring device includes an, especially as a photo-multiplier formed, light detector (10), detecting a light incidenting on an aperture (36) of an input mask (18), and a positioning arrangement (14, 14') for the alignment of a test disk with respect to the input mask. The test disk includes a number of test chambers (20) which are preferably arranged in a matrix, and which comprises respectively an upper measuring aperture (24), whereby respectively one of the test chambers (20) is arrangement in a measuring position of the input mask aperture. A cross screening (42) engages with the test disk, aligns with the measuring aperture of the test chamber located in the measuring position, and separates it from the measuring apertures of the adjacent test chambers.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; ger |
recordid | cdi_epo_espacenet_DE19704732A1 |
source | esp@cenet |
subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | Luminescence measurement device |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T18%3A39%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TRUMP,%20MARTIN,%2075305%20NEUENBUERG,%20DE&rft.date=1998-08-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EDE19704732A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |