Vorrichtung zur in-situ Messung von mechanischen Spannungen in Schichten
The system, for measuring the deformation of the substrate under test, has an inner housing supplied with a cooling medium through supply lines. The essential components of the optical distance measuring unit are arranged in the inner housing. The inner housing has electrically conducting material a...
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| creator | LUETHJE, HOLGER., 25469 HALSTENBEK, DE DAAUD, SIMONE., 38122 BRAUNSCHWEIG, DE |
| description | The system, for measuring the deformation of the substrate under test, has an inner housing supplied with a cooling medium through supply lines. The essential components of the optical distance measuring unit are arranged in the inner housing. The inner housing has electrically conducting material and lies at earth potential. A temp. sensor is provided in the inner housing. A regulating circuit regulates the cooling medium in such a manner that a specified temp. is held in the inner housing. |
| format | Patent |
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The essential components of the optical distance measuring unit are arranged in the inner housing. The inner housing has electrically conducting material and lies at earth potential. A temp. sensor is provided in the inner housing. A regulating circuit regulates the cooling medium in such a manner that a specified temp. is held in the inner housing.</description><edition>6</edition><language>ger</language><subject>BASIC ELECTRIC ELEMENTS ; COLORIMETRY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; RADIATION PYROMETRY ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>1996</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19961002&DB=EPODOC&CC=DE&NR=19516256C1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19961002&DB=EPODOC&CC=DE&NR=19516256C1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LUETHJE, HOLGER., 25469 HALSTENBEK, DE</creatorcontrib><creatorcontrib>DAAUD, SIMONE., 38122 BRAUNSCHWEIG, DE</creatorcontrib><title>Vorrichtung zur in-situ Messung von mechanischen Spannungen in Schichten</title><description>The system, for measuring the deformation of the substrate under test, has an inner housing supplied with a cooling medium through supply lines. 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The essential components of the optical distance measuring unit are arranged in the inner housing. The inner housing has electrically conducting material and lies at earth potential. A temp. sensor is provided in the inner housing. A regulating circuit regulates the cooling medium in such a manner that a specified temp. is held in the inner housing.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING |
| title | Vorrichtung zur in-situ Messung von mechanischen Spannungen in Schichten |
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