Verfahren zur modalen Analyse und Optimierung von Resonanzeigenschaften in einem elektromechanischen Produkt
Die Erfindung betrifft ein computer-implementiertes Verfahren zur Analyse eines CAD-Modells eines elektronischen bzw. elektrischen Systems (1) zur Bestimmung einer Verteilung mindestens einer konstruktiven Resonanzeigenschaftssensitivität, die eine konstruktive Sensitivität einer oder mehrerer Reson...
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| creator | Klaedtke, Andreas Benz, Jan Hansen, Jan |
| description | Die Erfindung betrifft ein computer-implementiertes Verfahren zur Analyse eines CAD-Modells eines elektronischen bzw. elektrischen Systems (1) zur Bestimmung einer Verteilung mindestens einer konstruktiven Resonanzeigenschaftssensitivität, die eine konstruktive Sensitivität einer oder mehrerer Resonanzeigenschaften in einem elektronischen bzw. elektrischen System (1) bezüglich einer geometrischen Position in dem System (1) oder einer Materialeigenschaft in dem System (1) angibt, wobei ein Netzwerkmodell (10) Funktionalbauteile (15), die die elektrischen und elektronischen Bauteile darstellen, und Parasitärbauteile (14), die die wirkenden Impedanzen von geometrischen Strukturen des Systems (1) darstellen, in einer Ersatzschaltung beschreibt. Ferner betrifft die Erfindung ein Computerprogrammprodukt sowie ein maschinenlesbares Speichermedium.
The invention relates to a computer-implemented method for analyzing a CAD model of an electronic or electrical system (1) in order to determine a distribution of at least one design resonance-property sensitivity which indicates a design sensitivity of one or more resonance properties in an electronic or electrical system (1) with respect to a geometric position in the system (1) or with respect to a material property in the system (1), wherein a network model (10) describes functional components (15) which represent the electrical and electronic components, and parasitic components (14) which represent the acting impedances of geometric structures of the system (1), in an equivalent circuit, the method comprising the following steps: - selecting (S4) an eigenmode in accordance with a resonance of the system (1) that is to be analyzed; - approximating one or more resonance properties of the resonance that is to be analyzed, in accordance with the eigenmode which by virtue of the properties of one is responsible for the resonance that is to be analyzed; - determining (S5) the resonance-property sensitivities (I) of the one or more resonance properties with respect to the impedance of each of the parasitic components (14) in accordance with the one or more resonance properties of the selected eigenmode; - ascertaining (S6) the design sensitivities (II) of the impedances of each of the parasitic components (14) in the system (1) with respect to at least one design parameter (p); - determining (S7) the at least one design resonance-property sensitivity in accordance with the at least one resonance-property sensitivity (III |
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The invention relates to a computer-implemented method for analyzing a CAD model of an electronic or electrical system (1) in order to determine a distribution of at least one design resonance-property sensitivity which indicates a design sensitivity of one or more resonance properties in an electronic or electrical system (1) with respect to a geometric position in the system (1) or with respect to a material property in the system (1), wherein a network model (10) describes functional components (15) which represent the electrical and electronic components, and parasitic components (14) which represent the acting impedances of geometric structures of the system (1), in an equivalent circuit, the method comprising the following steps: - selecting (S4) an eigenmode in accordance with a resonance of the system (1) that is to be analyzed; - approximating one or more resonance properties of the resonance that is to be analyzed, in accordance with the eigenmode which by virtue of the properties of one is responsible for the resonance that is to be analyzed; - determining (S5) the resonance-property sensitivities (I) of the one or more resonance properties with respect to the impedance of each of the parasitic components (14) in accordance with the one or more resonance properties of the selected eigenmode; - ascertaining (S6) the design sensitivities (II) of the impedances of each of the parasitic components (14) in the system (1) with respect to at least one design parameter (p); - determining (S7) the at least one design resonance-property sensitivity in accordance with the at least one resonance-property sensitivity (III) with respect to the impedance of each of the parasitic components (14), and in accordance with the at least one design sensitivity (IV) of the impedance with respect to the at least one design parameter (p); - adapting the structure and/or the configuration of the system (1) in accordance with the at least one design resonance-property sensitivity.</description><language>ger</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230323&DB=EPODOC&CC=DE&NR=102021210303A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230323&DB=EPODOC&CC=DE&NR=102021210303A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Klaedtke, Andreas</creatorcontrib><creatorcontrib>Benz, Jan</creatorcontrib><creatorcontrib>Hansen, Jan</creatorcontrib><title>Verfahren zur modalen Analyse und Optimierung von Resonanzeigenschaften in einem elektromechanischen Produkt</title><description>Die Erfindung betrifft ein computer-implementiertes Verfahren zur Analyse eines CAD-Modells eines elektronischen bzw. elektrischen Systems (1) zur Bestimmung einer Verteilung mindestens einer konstruktiven Resonanzeigenschaftssensitivität, die eine konstruktive Sensitivität einer oder mehrerer Resonanzeigenschaften in einem elektronischen bzw. elektrischen System (1) bezüglich einer geometrischen Position in dem System (1) oder einer Materialeigenschaft in dem System (1) angibt, wobei ein Netzwerkmodell (10) Funktionalbauteile (15), die die elektrischen und elektronischen Bauteile darstellen, und Parasitärbauteile (14), die die wirkenden Impedanzen von geometrischen Strukturen des Systems (1) darstellen, in einer Ersatzschaltung beschreibt. Ferner betrifft die Erfindung ein Computerprogrammprodukt sowie ein maschinenlesbares Speichermedium.
The invention relates to a computer-implemented method for analyzing a CAD model of an electronic or electrical system (1) in order to determine a distribution of at least one design resonance-property sensitivity which indicates a design sensitivity of one or more resonance properties in an electronic or electrical system (1) with respect to a geometric position in the system (1) or with respect to a material property in the system (1), wherein a network model (10) describes functional components (15) which represent the electrical and electronic components, and parasitic components (14) which represent the acting impedances of geometric structures of the system (1), in an equivalent circuit, the method comprising the following steps: - selecting (S4) an eigenmode in accordance with a resonance of the system (1) that is to be analyzed; - approximating one or more resonance properties of the resonance that is to be analyzed, in accordance with the eigenmode which by virtue of the properties of one is responsible for the resonance that is to be analyzed; - determining (S5) the resonance-property sensitivities (I) of the one or more resonance properties with respect to the impedance of each of the parasitic components (14) in accordance with the one or more resonance properties of the selected eigenmode; - ascertaining (S6) the design sensitivities (II) of the impedances of each of the parasitic components (14) in the system (1) with respect to at least one design parameter (p); - determining (S7) the at least one design resonance-property sensitivity in accordance with the at least one resonance-property sensitivity (III) with respect to the impedance of each of the parasitic components (14), and in accordance with the at least one design sensitivity (IV) of the impedance with respect to the at least one design parameter (p); - adapting the structure and/or the configuration of the system (1) in accordance with the at least one design resonance-property sensitivity.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNy00KwjAUBOBuXIh6h7dxKSTtCYpW3CkibktopzY0eSn5EezpzcIDuJqBb2ZdmCf8oEYPpiV5sq5XJvealfkEUOKernPUVsMnftHbMd0RHCteoF_g0I1qiPmhmaAZlmAwRe8ssrDOnvHmXZ-muC1WgzIBu19uiv25eRwvB8yuRZhVB0ZsT40UpShlKUUlqlpW_-6-s59ENQ</recordid><startdate>20230323</startdate><enddate>20230323</enddate><creator>Klaedtke, Andreas</creator><creator>Benz, Jan</creator><creator>Hansen, Jan</creator><scope>EVB</scope></search><sort><creationdate>20230323</creationdate><title>Verfahren zur modalen Analyse und Optimierung von Resonanzeigenschaften in einem elektromechanischen Produkt</title><author>Klaedtke, Andreas ; Benz, Jan ; Hansen, Jan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DE102021210303A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Klaedtke, Andreas</creatorcontrib><creatorcontrib>Benz, Jan</creatorcontrib><creatorcontrib>Hansen, Jan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Klaedtke, Andreas</au><au>Benz, Jan</au><au>Hansen, Jan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Verfahren zur modalen Analyse und Optimierung von Resonanzeigenschaften in einem elektromechanischen Produkt</title><date>2023-03-23</date><risdate>2023</risdate><abstract>Die Erfindung betrifft ein computer-implementiertes Verfahren zur Analyse eines CAD-Modells eines elektronischen bzw. elektrischen Systems (1) zur Bestimmung einer Verteilung mindestens einer konstruktiven Resonanzeigenschaftssensitivität, die eine konstruktive Sensitivität einer oder mehrerer Resonanzeigenschaften in einem elektronischen bzw. elektrischen System (1) bezüglich einer geometrischen Position in dem System (1) oder einer Materialeigenschaft in dem System (1) angibt, wobei ein Netzwerkmodell (10) Funktionalbauteile (15), die die elektrischen und elektronischen Bauteile darstellen, und Parasitärbauteile (14), die die wirkenden Impedanzen von geometrischen Strukturen des Systems (1) darstellen, in einer Ersatzschaltung beschreibt. Ferner betrifft die Erfindung ein Computerprogrammprodukt sowie ein maschinenlesbares Speichermedium.
The invention relates to a computer-implemented method for analyzing a CAD model of an electronic or electrical system (1) in order to determine a distribution of at least one design resonance-property sensitivity which indicates a design sensitivity of one or more resonance properties in an electronic or electrical system (1) with respect to a geometric position in the system (1) or with respect to a material property in the system (1), wherein a network model (10) describes functional components (15) which represent the electrical and electronic components, and parasitic components (14) which represent the acting impedances of geometric structures of the system (1), in an equivalent circuit, the method comprising the following steps: - selecting (S4) an eigenmode in accordance with a resonance of the system (1) that is to be analyzed; - approximating one or more resonance properties of the resonance that is to be analyzed, in accordance with the eigenmode which by virtue of the properties of one is responsible for the resonance that is to be analyzed; - determining (S5) the resonance-property sensitivities (I) of the one or more resonance properties with respect to the impedance of each of the parasitic components (14) in accordance with the one or more resonance properties of the selected eigenmode; - ascertaining (S6) the design sensitivities (II) of the impedances of each of the parasitic components (14) in the system (1) with respect to at least one design parameter (p); - determining (S7) the at least one design resonance-property sensitivity in accordance with the at least one resonance-property sensitivity (III) with respect to the impedance of each of the parasitic components (14), and in accordance with the at least one design sensitivity (IV) of the impedance with respect to the at least one design parameter (p); - adapting the structure and/or the configuration of the system (1) in accordance with the at least one design resonance-property sensitivity.</abstract><oa>free_for_read</oa></addata></record> |
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| title | Verfahren zur modalen Analyse und Optimierung von Resonanzeigenschaften in einem elektromechanischen Produkt |
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