Zerstörungsfreies Analyseverfahren zur Güteermittlung einer Dünnschichtsolarzelle mittels Photolumineszenzspektroskopie

Disclosed is an analytical method for determining the quality of a chalcopyrite-based solar cell using photoluminescence measurements. Said method, which is to allow the absorber material to be analyzed quickly, i.e. within seconds, taking photoluminescence measurements at room temperature, includes...

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Bibliographische Detailangaben

Hauptverfasser:	UNOLD, THOMAS, VOIGT, STEFAN, MEEDER, ALEXANDER
Format:	Patent
Sprache:	ger
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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