Surface crack size determining method, e.g. for building, involves determining crack edges and determining crack size based on adjustment amount of crack edges up to covering and reproduction scale
The method involves exposing a charge-coupled device (CCD) array (2) with a known reproduction scale using an optical system. A surface (10) of an object (11) is illuminated with two light sources (3, 4) whose rays fall in a fixed angular field on the surface. Crack edges are determined and are brou...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | NEUSS, HELMUT RIEDEL, BJOERN FRASER, CLIVE ZIEM, EBERHARD NIEMEIER, WOLFGANG STRATMANN, RAFAEL |
| description | The method involves exposing a charge-coupled device (CCD) array (2) with a known reproduction scale using an optical system. A surface (10) of an object (11) is illuminated with two light sources (3, 4) whose rays fall in a fixed angular field on the surface. Crack edges are determined and are brought on top of each other for covering. Crack size is determined based on adjustment amount of the crack edges up to covering and the reproduction scale.
Die Erfindung betrifft ein Verfahren und eine Vorrichtung zur Bestimmung einer Rissgröße in einem Objekt (11), bei denen über mehrere Lichtquellen (3, 4) ein Riss (6) unter einem definierten Einfallswinkelbereich beleuchtet und die Rissgröße anhand des Abbildungsmaßstabes und der Pixelanzahl eines CCD-Arrays (2) eines optischen Sensors ermittelt wird. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_DE102005023096B3</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>DE102005023096B3</sourcerecordid><originalsourceid>FETCH-epo_espacenet_DE102005023096B33</originalsourceid><addsrcrecordid>eNqNj79OwzAYxLMwVNB3-Ba2ELmJitQVCGJv98i1L8E08Rf5Twber-9Vp2WJxNDppLvT73Sr7LyPrpUKpJxUJ_LmF6QR4AZjje1oQPhmnROKrqCWHR2j6XVKcjJ24n6CX_RvGOgu-dLqf7LrxFF6aGJLUv9EHwbYQHLgmITbBSSOFJgUT3AzY2Y6jI51VMEkgFeyx1P20MreY_2nj9nzZ314_3rByA38mA5ahOaj3ohSiK0oK7F7fauqe3sXTOFkBg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Surface crack size determining method, e.g. for building, involves determining crack edges and determining crack size based on adjustment amount of crack edges up to covering and reproduction scale</title><source>esp@cenet</source><creator>NEUSS, HELMUT ; RIEDEL, BJOERN ; FRASER, CLIVE ; ZIEM, EBERHARD ; NIEMEIER, WOLFGANG ; STRATMANN, RAFAEL</creator><creatorcontrib>NEUSS, HELMUT ; RIEDEL, BJOERN ; FRASER, CLIVE ; ZIEM, EBERHARD ; NIEMEIER, WOLFGANG ; STRATMANN, RAFAEL</creatorcontrib><description>The method involves exposing a charge-coupled device (CCD) array (2) with a known reproduction scale using an optical system. A surface (10) of an object (11) is illuminated with two light sources (3, 4) whose rays fall in a fixed angular field on the surface. Crack edges are determined and are brought on top of each other for covering. Crack size is determined based on adjustment amount of the crack edges up to covering and the reproduction scale.
Die Erfindung betrifft ein Verfahren und eine Vorrichtung zur Bestimmung einer Rissgröße in einem Objekt (11), bei denen über mehrere Lichtquellen (3, 4) ein Riss (6) unter einem definierten Einfallswinkelbereich beleuchtet und die Rissgröße anhand des Abbildungsmaßstabes und der Pixelanzahl eines CCD-Arrays (2) eines optischen Sensors ermittelt wird.</description><language>eng ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20061228&DB=EPODOC&CC=DE&NR=102005023096B3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20061228&DB=EPODOC&CC=DE&NR=102005023096B3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NEUSS, HELMUT</creatorcontrib><creatorcontrib>RIEDEL, BJOERN</creatorcontrib><creatorcontrib>FRASER, CLIVE</creatorcontrib><creatorcontrib>ZIEM, EBERHARD</creatorcontrib><creatorcontrib>NIEMEIER, WOLFGANG</creatorcontrib><creatorcontrib>STRATMANN, RAFAEL</creatorcontrib><title>Surface crack size determining method, e.g. for building, involves determining crack edges and determining crack size based on adjustment amount of crack edges up to covering and reproduction scale</title><description>The method involves exposing a charge-coupled device (CCD) array (2) with a known reproduction scale using an optical system. A surface (10) of an object (11) is illuminated with two light sources (3, 4) whose rays fall in a fixed angular field on the surface. Crack edges are determined and are brought on top of each other for covering. Crack size is determined based on adjustment amount of the crack edges up to covering and the reproduction scale.
Die Erfindung betrifft ein Verfahren und eine Vorrichtung zur Bestimmung einer Rissgröße in einem Objekt (11), bei denen über mehrere Lichtquellen (3, 4) ein Riss (6) unter einem definierten Einfallswinkelbereich beleuchtet und die Rissgröße anhand des Abbildungsmaßstabes und der Pixelanzahl eines CCD-Arrays (2) eines optischen Sensors ermittelt wird.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNj79OwzAYxLMwVNB3-Ba2ELmJitQVCGJv98i1L8E08Rf5Twber-9Vp2WJxNDppLvT73Sr7LyPrpUKpJxUJ_LmF6QR4AZjje1oQPhmnROKrqCWHR2j6XVKcjJ24n6CX_RvGOgu-dLqf7LrxFF6aGJLUv9EHwbYQHLgmITbBSSOFJgUT3AzY2Y6jI51VMEkgFeyx1P20MreY_2nj9nzZ314_3rByA38mA5ahOaj3ohSiK0oK7F7fauqe3sXTOFkBg</recordid><startdate>20061228</startdate><enddate>20061228</enddate><creator>NEUSS, HELMUT</creator><creator>RIEDEL, BJOERN</creator><creator>FRASER, CLIVE</creator><creator>ZIEM, EBERHARD</creator><creator>NIEMEIER, WOLFGANG</creator><creator>STRATMANN, RAFAEL</creator><scope>EVB</scope></search><sort><creationdate>20061228</creationdate><title>Surface crack size determining method, e.g. for building, involves determining crack edges and determining crack size based on adjustment amount of crack edges up to covering and reproduction scale</title><author>NEUSS, HELMUT ; RIEDEL, BJOERN ; FRASER, CLIVE ; ZIEM, EBERHARD ; NIEMEIER, WOLFGANG ; STRATMANN, RAFAEL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DE102005023096B33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; ger</language><creationdate>2006</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NEUSS, HELMUT</creatorcontrib><creatorcontrib>RIEDEL, BJOERN</creatorcontrib><creatorcontrib>FRASER, CLIVE</creatorcontrib><creatorcontrib>ZIEM, EBERHARD</creatorcontrib><creatorcontrib>NIEMEIER, WOLFGANG</creatorcontrib><creatorcontrib>STRATMANN, RAFAEL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NEUSS, HELMUT</au><au>RIEDEL, BJOERN</au><au>FRASER, CLIVE</au><au>ZIEM, EBERHARD</au><au>NIEMEIER, WOLFGANG</au><au>STRATMANN, RAFAEL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Surface crack size determining method, e.g. for building, involves determining crack edges and determining crack size based on adjustment amount of crack edges up to covering and reproduction scale</title><date>2006-12-28</date><risdate>2006</risdate><abstract>The method involves exposing a charge-coupled device (CCD) array (2) with a known reproduction scale using an optical system. A surface (10) of an object (11) is illuminated with two light sources (3, 4) whose rays fall in a fixed angular field on the surface. Crack edges are determined and are brought on top of each other for covering. Crack size is determined based on adjustment amount of the crack edges up to covering and the reproduction scale.
Die Erfindung betrifft ein Verfahren und eine Vorrichtung zur Bestimmung einer Rissgröße in einem Objekt (11), bei denen über mehrere Lichtquellen (3, 4) ein Riss (6) unter einem definierten Einfallswinkelbereich beleuchtet und die Rissgröße anhand des Abbildungsmaßstabes und der Pixelanzahl eines CCD-Arrays (2) eines optischen Sensors ermittelt wird.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; ger |
| recordid | cdi_epo_espacenet_DE102005023096B3 |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Surface crack size determining method, e.g. for building, involves determining crack edges and determining crack size based on adjustment amount of crack edges up to covering and reproduction scale |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T19%3A59%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NEUSS,%20HELMUT&rft.date=2006-12-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EDE102005023096B3%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |