Gedruckte-Schaltungsplatine-Testzugangspunktstrukturen und Verfahren zum Herstellen derselben
A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. In an x-, y-, z-coordinate system where traces are printed along an x-y plane, the z-dimension is used to implement test access point structures. Each test access point...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | PEIFFER, RONALD J LEINBACH, GLEN E PARKER, KENNETH P |
description | A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. In an x-, y-, z-coordinate system where traces are printed along an x-y plane, the z-dimension is used to implement test access point structures. Each test access point structure is conductively connected to a trace at a test access point directly on top of the trace and along the z axis of the x-, y-, z-coordinate system above an exposed surface of the printed circuit board to be accessible for electrical probing by an external device. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_DE102004045719B4</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>DE102004045719B4</sourcerecordid><originalsourceid>FETCH-epo_espacenet_DE102004045719B43</originalsourceid><addsrcrecordid>eNqNirEOgjAURVkcjPoPLI5NimKMq4qyS9wMqXABQ3027XsLXy8kfoDTuefmzKPHFbWXqmeoW9UZy0JtcNbwi6AKBB6kNdMl1HNgLz2LB8VCdXyHb0w32SDvOIcPDGtHrccJ-wQto1ljbMDqx0W0vmTFKVdwnxLBmQoELs9Zojdapzrd7ZPDMd3-230B-F0_rw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Gedruckte-Schaltungsplatine-Testzugangspunktstrukturen und Verfahren zum Herstellen derselben</title><source>esp@cenet</source><creator>PEIFFER, RONALD J ; LEINBACH, GLEN E ; PARKER, KENNETH P</creator><creatorcontrib>PEIFFER, RONALD J ; LEINBACH, GLEN E ; PARKER, KENNETH P</creatorcontrib><description>A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. In an x-, y-, z-coordinate system where traces are printed along an x-y plane, the z-dimension is used to implement test access point structures. Each test access point structure is conductively connected to a trace at a test access point directly on top of the trace and along the z axis of the x-, y-, z-coordinate system above an exposed surface of the printed circuit board to be accessible for electrical probing by an external device.</description><language>ger</language><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PRINTED CIRCUITS ; TESTING</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070125&DB=EPODOC&CC=DE&NR=102004045719B4$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070125&DB=EPODOC&CC=DE&NR=102004045719B4$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PEIFFER, RONALD J</creatorcontrib><creatorcontrib>LEINBACH, GLEN E</creatorcontrib><creatorcontrib>PARKER, KENNETH P</creatorcontrib><title>Gedruckte-Schaltungsplatine-Testzugangspunktstrukturen und Verfahren zum Herstellen derselben</title><description>A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. In an x-, y-, z-coordinate system where traces are printed along an x-y plane, the z-dimension is used to implement test access point structures. Each test access point structure is conductively connected to a trace at a test access point directly on top of the trace and along the z axis of the x-, y-, z-coordinate system above an exposed surface of the printed circuit board to be accessible for electrical probing by an external device.</description><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PRINTED CIRCUITS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirEOgjAURVkcjPoPLI5NimKMq4qyS9wMqXABQ3027XsLXy8kfoDTuefmzKPHFbWXqmeoW9UZy0JtcNbwi6AKBB6kNdMl1HNgLz2LB8VCdXyHb0w32SDvOIcPDGtHrccJ-wQto1ljbMDqx0W0vmTFKVdwnxLBmQoELs9Zojdapzrd7ZPDMd3-230B-F0_rw</recordid><startdate>20070125</startdate><enddate>20070125</enddate><creator>PEIFFER, RONALD J</creator><creator>LEINBACH, GLEN E</creator><creator>PARKER, KENNETH P</creator><scope>EVB</scope></search><sort><creationdate>20070125</creationdate><title>Gedruckte-Schaltungsplatine-Testzugangspunktstrukturen und Verfahren zum Herstellen derselben</title><author>PEIFFER, RONALD J ; LEINBACH, GLEN E ; PARKER, KENNETH P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_DE102004045719B43</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>2007</creationdate><topic>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PRINTED CIRCUITS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PEIFFER, RONALD J</creatorcontrib><creatorcontrib>LEINBACH, GLEN E</creatorcontrib><creatorcontrib>PARKER, KENNETH P</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PEIFFER, RONALD J</au><au>LEINBACH, GLEN E</au><au>PARKER, KENNETH P</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Gedruckte-Schaltungsplatine-Testzugangspunktstrukturen und Verfahren zum Herstellen derselben</title><date>2007-01-25</date><risdate>2007</risdate><abstract>A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. In an x-, y-, z-coordinate system where traces are printed along an x-y plane, the z-dimension is used to implement test access point structures. Each test access point structure is conductively connected to a trace at a test access point directly on top of the trace and along the z axis of the x-, y-, z-coordinate system above an exposed surface of the printed circuit board to be accessible for electrical probing by an external device.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | ger |
recordid | cdi_epo_espacenet_DE102004045719B4 |
source | esp@cenet |
subjects | CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TESTING |
title | Gedruckte-Schaltungsplatine-Testzugangspunktstrukturen und Verfahren zum Herstellen derselben |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T21%3A04%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=PEIFFER,%20RONALD%20J&rft.date=2007-01-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EDE102004045719B4%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |