Detecting dicyane by a semiconductor sensor with a planar structure
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | cze ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Dědič, Jan Vrňata, Martin Černý, Radek Moravec, Vlastík Dymák, Michal Fitl, Přemysl Fišer, Ladislav Dropa, Tomáš Novotný, Michal Bodnár, Michal |
| description | |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CZ36251UU1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CZ36251UU1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CZ36251UU13</originalsourceid><addsrcrecordid>eNrjZHB2SS1JTS7JzEtXSMlMrkzMS1VIqlRIVChOzc1Mzs9LKU0uyS8C8vKKgVR5ZkkGUK4gJzEvEShYUgSULS1K5WFgTUvMKU7lhdLcDPJuriHOHrqpBfnxqcUFicmpeakl8c5RxmZGpoahoYbGhFUAANCHMkk</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Detecting dicyane by a semiconductor sensor with a planar structure</title><source>esp@cenet</source><creator>Dědič, Jan ; Vrňata, Martin ; Černý, Radek ; Moravec, Vlastík ; Dymák, Michal ; Fitl, Přemysl ; Fišer, Ladislav ; Dropa, Tomáš ; Novotný, Michal ; Bodnár, Michal</creator><creatorcontrib>Dědič, Jan ; Vrňata, Martin ; Černý, Radek ; Moravec, Vlastík ; Dymák, Michal ; Fitl, Přemysl ; Fišer, Ladislav ; Dropa, Tomáš ; Novotný, Michal ; Bodnár, Michal</creatorcontrib><language>cze ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220809&DB=EPODOC&CC=CZ&NR=36251U1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220809&DB=EPODOC&CC=CZ&NR=36251U1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Dědič, Jan</creatorcontrib><creatorcontrib>Vrňata, Martin</creatorcontrib><creatorcontrib>Černý, Radek</creatorcontrib><creatorcontrib>Moravec, Vlastík</creatorcontrib><creatorcontrib>Dymák, Michal</creatorcontrib><creatorcontrib>Fitl, Přemysl</creatorcontrib><creatorcontrib>Fišer, Ladislav</creatorcontrib><creatorcontrib>Dropa, Tomáš</creatorcontrib><creatorcontrib>Novotný, Michal</creatorcontrib><creatorcontrib>Bodnár, Michal</creatorcontrib><title>Detecting dicyane by a semiconductor sensor with a planar structure</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHB2SS1JTS7JzEtXSMlMrkzMS1VIqlRIVChOzc1Mzs9LKU0uyS8C8vKKgVR5ZkkGUK4gJzEvEShYUgSULS1K5WFgTUvMKU7lhdLcDPJuriHOHrqpBfnxqcUFicmpeakl8c5RxmZGpoahoYbGhFUAANCHMkk</recordid><startdate>20220809</startdate><enddate>20220809</enddate><creator>Dědič, Jan</creator><creator>Vrňata, Martin</creator><creator>Černý, Radek</creator><creator>Moravec, Vlastík</creator><creator>Dymák, Michal</creator><creator>Fitl, Přemysl</creator><creator>Fišer, Ladislav</creator><creator>Dropa, Tomáš</creator><creator>Novotný, Michal</creator><creator>Bodnár, Michal</creator><scope>EVB</scope></search><sort><creationdate>20220809</creationdate><title>Detecting dicyane by a semiconductor sensor with a planar structure</title><author>Dědič, Jan ; Vrňata, Martin ; Černý, Radek ; Moravec, Vlastík ; Dymák, Michal ; Fitl, Přemysl ; Fišer, Ladislav ; Dropa, Tomáš ; Novotný, Michal ; Bodnár, Michal</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CZ36251UU13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>cze ; eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Dědič, Jan</creatorcontrib><creatorcontrib>Vrňata, Martin</creatorcontrib><creatorcontrib>Černý, Radek</creatorcontrib><creatorcontrib>Moravec, Vlastík</creatorcontrib><creatorcontrib>Dymák, Michal</creatorcontrib><creatorcontrib>Fitl, Přemysl</creatorcontrib><creatorcontrib>Fišer, Ladislav</creatorcontrib><creatorcontrib>Dropa, Tomáš</creatorcontrib><creatorcontrib>Novotný, Michal</creatorcontrib><creatorcontrib>Bodnár, Michal</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dědič, Jan</au><au>Vrňata, Martin</au><au>Černý, Radek</au><au>Moravec, Vlastík</au><au>Dymák, Michal</au><au>Fitl, Přemysl</au><au>Fišer, Ladislav</au><au>Dropa, Tomáš</au><au>Novotný, Michal</au><au>Bodnár, Michal</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Detecting dicyane by a semiconductor sensor with a planar structure</title><date>2022-08-09</date><risdate>2022</risdate><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | cze ; eng |
| recordid | cdi_epo_espacenet_CZ36251UU1 |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Detecting dicyane by a semiconductor sensor with a planar structure |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T18%3A58%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=D%C4%9Bdi%C4%8D,%20Jan&rft.date=2022-08-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECZ36251UU1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |