Semiconductor strain gauge drilling rose
Polovodicová tenzometrická odvrtávací ružice se skládá z podložky ružice (1), na které je oznacen stred (2) pro vrtaný otvor. Na podložku ružice (1) jsou v okolí oznaceného stredu (2) v ruzných místech a v urcité vzdálenosti od stredu (2) ružice (1) pevne uchyceny alespon tri polovodicové tenzometry...
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| creator | DOUBRAVA KAREL VITEK KAREL HOLY STANISLAV HRUBANT LADISLAV MARES TOMAS |
| description | Polovodicová tenzometrická odvrtávací ružice se skládá z podložky ružice (1), na které je oznacen stred (2) pro vrtaný otvor. Na podložku ružice (1) jsou v okolí oznaceného stredu (2) v ruzných místech a v urcité vzdálenosti od stredu (2) ružice (1) pevne uchyceny alespon tri polovodicové tenzometry (3) opatrené kontakty k pripojení na mericí aparaturu. U druhé varianty této polovodicové ružice je navíc vedle každého polovodicového tenzometru (3) pritmelen nebo prilepen k podložce ružice (1) polovodicový teplomer (4) opatrený kontakty k pripojení na mericí aparaturu.
The present invention relates to a semiconductor strain gauge drilling rose consisting of a rose (1) backplate with a center (2) marked thereon for a hole to be drilled. At least three semiconductor strain gauges (3) are fixedly attached to the rose backplate (1) in the vicinity of the marked center (2) and at different spots and at a certain distance from the rose (1) center. The strain gauges (3) are provided with contacts for connecting to a measuring apparatus. In a second embodiment of the above-described semiconductor rose, a semiconductor thermometer (4) provided with contacts for connecting thereof to the measuring apparatus is cemented or bonded next to each semiconductor strain gauge (3) to the rose (1) backplate. |
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The present invention relates to a semiconductor strain gauge drilling rose consisting of a rose (1) backplate with a center (2) marked thereon for a hole to be drilled. At least three semiconductor strain gauges (3) are fixedly attached to the rose backplate (1) in the vicinity of the marked center (2) and at different spots and at a certain distance from the rose (1) center. The strain gauges (3) are provided with contacts for connecting to a measuring apparatus. In a second embodiment of the above-described semiconductor rose, a semiconductor thermometer (4) provided with contacts for connecting thereof to the measuring apparatus is cemented or bonded next to each semiconductor strain gauge (3) to the rose (1) backplate.</description><language>cze ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101020&DB=EPODOC&CC=CZ&NR=302108B6$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101020&DB=EPODOC&CC=CZ&NR=302108B6$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DOUBRAVA KAREL</creatorcontrib><creatorcontrib>VITEK KAREL</creatorcontrib><creatorcontrib>HOLY STANISLAV</creatorcontrib><creatorcontrib>HRUBANT LADISLAV</creatorcontrib><creatorcontrib>MARES TOMAS</creatorcontrib><title>Semiconductor strain gauge drilling rose</title><description>Polovodicová tenzometrická odvrtávací ružice se skládá z podložky ružice (1), na které je oznacen stred (2) pro vrtaný otvor. Na podložku ružice (1) jsou v okolí oznaceného stredu (2) v ruzných místech a v urcité vzdálenosti od stredu (2) ružice (1) pevne uchyceny alespon tri polovodicové tenzometry (3) opatrené kontakty k pripojení na mericí aparaturu. U druhé varianty této polovodicové ružice je navíc vedle každého polovodicového tenzometru (3) pritmelen nebo prilepen k podložce ružice (1) polovodicový teplomer (4) opatrený kontakty k pripojení na mericí aparaturu.
The present invention relates to a semiconductor strain gauge drilling rose consisting of a rose (1) backplate with a center (2) marked thereon for a hole to be drilled. At least three semiconductor strain gauges (3) are fixedly attached to the rose backplate (1) in the vicinity of the marked center (2) and at different spots and at a certain distance from the rose (1) center. The strain gauges (3) are provided with contacts for connecting to a measuring apparatus. In a second embodiment of the above-described semiconductor rose, a semiconductor thermometer (4) provided with contacts for connecting thereof to the measuring apparatus is cemented or bonded next to each semiconductor strain gauge (3) to the rose (1) backplate.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAITs3NTM7PSylNLskvUiguKUrMzFNITyxNT1VIKcrMycnMS1coyi9O5WFgTUvMKU7lhdLcDPJuriHOHrqpBfnxqcUFicmpeakl8c5RxgZGhgYWTmbGhFUAAFpEJ9Q</recordid><startdate>20101020</startdate><enddate>20101020</enddate><creator>DOUBRAVA KAREL</creator><creator>VITEK KAREL</creator><creator>HOLY STANISLAV</creator><creator>HRUBANT LADISLAV</creator><creator>MARES TOMAS</creator><scope>EVB</scope></search><sort><creationdate>20101020</creationdate><title>Semiconductor strain gauge drilling rose</title><author>DOUBRAVA KAREL ; VITEK KAREL ; HOLY STANISLAV ; HRUBANT LADISLAV ; MARES TOMAS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CZ302108B63</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>cze ; eng</language><creationdate>2010</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>DOUBRAVA KAREL</creatorcontrib><creatorcontrib>VITEK KAREL</creatorcontrib><creatorcontrib>HOLY STANISLAV</creatorcontrib><creatorcontrib>HRUBANT LADISLAV</creatorcontrib><creatorcontrib>MARES TOMAS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DOUBRAVA KAREL</au><au>VITEK KAREL</au><au>HOLY STANISLAV</au><au>HRUBANT LADISLAV</au><au>MARES TOMAS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Semiconductor strain gauge drilling rose</title><date>2010-10-20</date><risdate>2010</risdate><abstract>Polovodicová tenzometrická odvrtávací ružice se skládá z podložky ružice (1), na které je oznacen stred (2) pro vrtaný otvor. Na podložku ružice (1) jsou v okolí oznaceného stredu (2) v ruzných místech a v urcité vzdálenosti od stredu (2) ružice (1) pevne uchyceny alespon tri polovodicové tenzometry (3) opatrené kontakty k pripojení na mericí aparaturu. U druhé varianty této polovodicové ružice je navíc vedle každého polovodicového tenzometru (3) pritmelen nebo prilepen k podložce ružice (1) polovodicový teplomer (4) opatrený kontakty k pripojení na mericí aparaturu.
The present invention relates to a semiconductor strain gauge drilling rose consisting of a rose (1) backplate with a center (2) marked thereon for a hole to be drilled. At least three semiconductor strain gauges (3) are fixedly attached to the rose backplate (1) in the vicinity of the marked center (2) and at different spots and at a certain distance from the rose (1) center. The strain gauges (3) are provided with contacts for connecting to a measuring apparatus. In a second embodiment of the above-described semiconductor rose, a semiconductor thermometer (4) provided with contacts for connecting thereof to the measuring apparatus is cemented or bonded next to each semiconductor strain gauge (3) to the rose (1) backplate.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS SEMICONDUCTOR DEVICES TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR |
| title | Semiconductor strain gauge drilling rose |
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