SCANNING DEVICE WITH A SET OF INTEGRATED OPTOELECTRONIC CIRCUITS

Bibliographische Detailangaben

Hauptverfasser:	STUCHLIK,ZDENEK,CS, FOBER,JAROSLAV,CS
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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