CONNECTION FOR FAST MEASURING OF RESISTORS

CONNECTION FOR FAST MEASURING OF RESISTORS

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Hauptverfasser: MATTAUSCH,PAVEL,CS, KOLLINER,RENE,CS, UHLIR,KAREL,CS
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator MATTAUSCH,PAVEL,CS
KOLLINER,RENE,CS
UHLIR,KAREL,CS
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CS238600B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CS238600B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CS238600B13</originalsourceid><addsrcrecordid>eNrjZNBy9vfzc3UO8fT3U3DzD1JwcwwOUfB1dQwODfL0c1fwd1MIcg32DA7xDwrmYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxzsFGxhZmBgZOhsaEVQAA0LAj9A</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CONNECTION FOR FAST MEASURING OF RESISTORS</title><source>esp@cenet</source><creator>MATTAUSCH,PAVEL,CS ; KOLLINER,RENE,CS ; UHLIR,KAREL,CS</creator><creatorcontrib>MATTAUSCH,PAVEL,CS ; KOLLINER,RENE,CS ; UHLIR,KAREL,CS</creatorcontrib><edition>4</edition><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1985</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19851216&amp;DB=EPODOC&amp;CC=CS&amp;NR=238600B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19851216&amp;DB=EPODOC&amp;CC=CS&amp;NR=238600B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MATTAUSCH,PAVEL,CS</creatorcontrib><creatorcontrib>KOLLINER,RENE,CS</creatorcontrib><creatorcontrib>UHLIR,KAREL,CS</creatorcontrib><title>CONNECTION FOR FAST MEASURING OF RESISTORS</title><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1985</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBy9vfzc3UO8fT3U3DzD1JwcwwOUfB1dQwODfL0c1fwd1MIcg32DA7xDwrmYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxzsFGxhZmBgZOhsaEVQAA0LAj9A</recordid><startdate>19851216</startdate><enddate>19851216</enddate><creator>MATTAUSCH,PAVEL,CS</creator><creator>KOLLINER,RENE,CS</creator><creator>UHLIR,KAREL,CS</creator><scope>EVB</scope></search><sort><creationdate>19851216</creationdate><title>CONNECTION FOR FAST MEASURING OF RESISTORS</title><author>MATTAUSCH,PAVEL,CS ; KOLLINER,RENE,CS ; UHLIR,KAREL,CS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CS238600B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1985</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MATTAUSCH,PAVEL,CS</creatorcontrib><creatorcontrib>KOLLINER,RENE,CS</creatorcontrib><creatorcontrib>UHLIR,KAREL,CS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MATTAUSCH,PAVEL,CS</au><au>KOLLINER,RENE,CS</au><au>UHLIR,KAREL,CS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CONNECTION FOR FAST MEASURING OF RESISTORS</title><date>1985-12-16</date><risdate>1985</risdate><edition>4</edition><oa>free_for_read</oa></addata></record>
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recordid cdi_epo_espacenet_CS238600B1
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title CONNECTION FOR FAST MEASURING OF RESISTORS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T05%3A16%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MATTAUSCH,PAVEL,CS&rft.date=1985-12-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECS238600B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true