Measuring device for remote object microdisplacement

Disclosed is a micro-displacement measuring device far from the object, comprising light paths composed of light sources, optical elements and an optical signal reading processor. The utility model is characterized in that the utility model comprises two light paths; one light path is a spherical mirror light path, and the other is a plane mirror light path; in the spherical mirror light path, the light is emitted by one point light source, and then the light is reflected by an imaging lens to obtain a first image point, and then the first image point is reflected by the spherical mirror to be imaged on a CCD device to form a second image point; in the plane mirror light path, the light is emitted by the other point light source, and then the light is reflected by the imaging lens and a plane mirror to be imaged on the CCD device. The point light sources in the light paths, the imaging lens and the CCD device are placed on a fixed body, and the spherical mirror and the plane mirror are placed on an active body.