Testing device used after chip packaging

Testing device used after chip packaging

The utility model relates to the technical field of chip processing, and discloses a testing device used after chip packaging, which comprises an operation table, supporting legs are fixedly arranged on the periphery of the bottom end of the operation table, a fixed seat is fixedly arranged at the t...

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Hauptverfasser: HUANG ZIYANG, WU QIONG, XUE QINGLONG, GE HUIZONG
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator HUANG ZIYANG
WU QIONG
XUE QINGLONG
GE HUIZONG
description The utility model relates to the technical field of chip processing, and discloses a testing device used after chip packaging, which comprises an operation table, supporting legs are fixedly arranged on the periphery of the bottom end of the operation table, a fixed seat is fixedly arranged at the top end of the operation table, and a positioning plate is fixedly arranged at the top end of the operation table and positioned on one side of the fixed seat. A chip detection device is arranged above the fixed seat in the positioning plate, a test board is arranged at the top end of the fixed seat, the position of a to-be-tested chip can be effectively fixed through a driving structure and a guiding structure, the chip is prevented from shifting during testing, the output end of a driving motor drives a worm to rotate, and the detection accuracy is improved. The worm drives the worm wheel meshed with the worm to rotate together, the worm wheel enables the rotating rod and the guide disc to rotate, at the moment, t
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN221726173UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN221726173UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN221726173UU3</originalsourceid><addsrcrecordid>eNrjZNAISS0uycxLV0hJLctMTlUoLU5NUUhMK0ktUkjOyCxQKEhMzk5MByrgYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxUB1qXmpJfHOfkZGhuZGZobmxqGhxkQpAgALuSjb</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Testing device used after chip packaging</title><source>esp@cenet</source><creator>HUANG ZIYANG ; WU QIONG ; XUE QINGLONG ; GE HUIZONG</creator><creatorcontrib>HUANG ZIYANG ; WU QIONG ; XUE QINGLONG ; GE HUIZONG</creatorcontrib><description>The utility model relates to the technical field of chip processing, and discloses a testing device used after chip packaging, which comprises an operation table, supporting legs are fixedly arranged on the periphery of the bottom end of the operation table, a fixed seat is fixedly arranged at the top end of the operation table, and a positioning plate is fixedly arranged at the top end of the operation table and positioned on one side of the fixed seat. A chip detection device is arranged above the fixed seat in the positioning plate, a test board is arranged at the top end of the fixed seat, the position of a to-be-tested chip can be effectively fixed through a driving structure and a guiding structure, the chip is prevented from shifting during testing, the output end of a driving motor drives a worm to rotate, and the detection accuracy is improved. The worm drives the worm wheel meshed with the worm to rotate together, the worm wheel enables the rotating rod and the guide disc to rotate, at the moment, t</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240917&amp;DB=EPODOC&amp;CC=CN&amp;NR=221726173U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240917&amp;DB=EPODOC&amp;CC=CN&amp;NR=221726173U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG ZIYANG</creatorcontrib><creatorcontrib>WU QIONG</creatorcontrib><creatorcontrib>XUE QINGLONG</creatorcontrib><creatorcontrib>GE HUIZONG</creatorcontrib><title>Testing device used after chip packaging</title><description>The utility model relates to the technical field of chip processing, and discloses a testing device used after chip packaging, which comprises an operation table, supporting legs are fixedly arranged on the periphery of the bottom end of the operation table, a fixed seat is fixedly arranged at the top end of the operation table, and a positioning plate is fixedly arranged at the top end of the operation table and positioned on one side of the fixed seat. A chip detection device is arranged above the fixed seat in the positioning plate, a test board is arranged at the top end of the fixed seat, the position of a to-be-tested chip can be effectively fixed through a driving structure and a guiding structure, the chip is prevented from shifting during testing, the output end of a driving motor drives a worm to rotate, and the detection accuracy is improved. The worm drives the worm wheel meshed with the worm to rotate together, the worm wheel enables the rotating rod and the guide disc to rotate, at the moment, t</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAISS0uycxLV0hJLctMTlUoLU5NUUhMK0ktUkjOyCxQKEhMzk5MByrgYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxUB1qXmpJfHOfkZGhuZGZobmxqGhxkQpAgALuSjb</recordid><startdate>20240917</startdate><enddate>20240917</enddate><creator>HUANG ZIYANG</creator><creator>WU QIONG</creator><creator>XUE QINGLONG</creator><creator>GE HUIZONG</creator><scope>EVB</scope></search><sort><creationdate>20240917</creationdate><title>Testing device used after chip packaging</title><author>HUANG ZIYANG ; WU QIONG ; XUE QINGLONG ; GE HUIZONG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN221726173UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG ZIYANG</creatorcontrib><creatorcontrib>WU QIONG</creatorcontrib><creatorcontrib>XUE QINGLONG</creatorcontrib><creatorcontrib>GE HUIZONG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG ZIYANG</au><au>WU QIONG</au><au>XUE QINGLONG</au><au>GE HUIZONG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Testing device used after chip packaging</title><date>2024-09-17</date><risdate>2024</risdate><abstract>The utility model relates to the technical field of chip processing, and discloses a testing device used after chip packaging, which comprises an operation table, supporting legs are fixedly arranged on the periphery of the bottom end of the operation table, a fixed seat is fixedly arranged at the top end of the operation table, and a positioning plate is fixedly arranged at the top end of the operation table and positioned on one side of the fixed seat. A chip detection device is arranged above the fixed seat in the positioning plate, a test board is arranged at the top end of the fixed seat, the position of a to-be-tested chip can be effectively fixed through a driving structure and a guiding structure, the chip is prevented from shifting during testing, the output end of a driving motor drives a worm to rotate, and the detection accuracy is improved. The worm drives the worm wheel meshed with the worm to rotate together, the worm wheel enables the rotating rod and the guide disc to rotate, at the moment, t</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Testing device used after chip packaging
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T10%3A43%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HUANG%20ZIYANG&rft.date=2024-09-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN221726173UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true