Multifunctional panel for chip test integrated measurement cabinet

The utility model discloses a multifunctional panel for a chip test integration measurement cabinet, which comprises a test cabinet and a panel window arranged on the test cabinet, the multifunctional panel comprises a connecting base detachably connected to the test cabinet and a turnover panel hin...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	DONG XINYI, LI ZEHENG, TAO HONGQI, LI YUQIAO, CHEN GUBIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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