Adjustable semiconductor discrete device test fixture
The utility model discloses an adjustable semiconductor discrete device test fixture, which comprises a hollow box, the top of the hollow box is provided with two through holes, the adjustable semiconductor discrete device test fixture is provided with a protective shell, a worker firstly places an...
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| creator | LYU XIAOLEI |
| description | The utility model discloses an adjustable semiconductor discrete device test fixture, which comprises a hollow box, the top of the hollow box is provided with two through holes, the adjustable semiconductor discrete device test fixture is provided with a protective shell, a worker firstly places an external semiconductor discrete device on the top of a placing plate, and the protective shell is arranged on the top of the placing plate; then, a rotating block is grabbed to rotate to drive a bidirectional screw rod to rotate with the bidirectional screw rod as the circle center, the bidirectional screw rod drives two threaded pipes to move towards each other under the action of threads, a connecting plate drives a round sleeve to move, a rubber plate is moved to make contact with the two sides of the discrete semiconductor device, the rotating block continues to be rotated, and the rubber plate is compressed and deformed; a rubber plate pushes a square rod and a baffle to move towards the inner side of a round |
| format | Patent |
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then, a rotating block is grabbed to rotate to drive a bidirectional screw rod to rotate with the bidirectional screw rod as the circle center, the bidirectional screw rod drives two threaded pipes to move towards each other under the action of threads, a connecting plate drives a round sleeve to move, a rubber plate is moved to make contact with the two sides of the discrete semiconductor device, the rotating block continues to be rotated, and the rubber plate is compressed and deformed; a rubber plate pushes a square rod and a baffle to move towards the inner side of a round</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240806&DB=EPODOC&CC=CN&NR=221485466U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240806&DB=EPODOC&CC=CN&NR=221485466U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LYU XIAOLEI</creatorcontrib><title>Adjustable semiconductor discrete device test fixture</title><description>The utility model discloses an adjustable semiconductor discrete device test fixture, which comprises a hollow box, the top of the hollow box is provided with two through holes, the adjustable semiconductor discrete device test fixture is provided with a protective shell, a worker firstly places an external semiconductor discrete device on the top of a placing plate, and the protective shell is arranged on the top of the placing plate; 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| language | chi ; eng |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Adjustable semiconductor discrete device test fixture |
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